X-ray inspection device

An X-ray inspection device, comprising:

• a conveying unit configured to convey an article;
• an X-ray irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays;
• an X-ray detection unit configured to detect the X-rays with which the X-ray irradiation unit irradiates the article and which transmit through the article;
• an X-ray transmission image generation unit configured to generate an X-ray transmission image based on the X-rays detected by the X-ray detection unit;
• and
• an inspection unit configured to inspect whether foreign matter is included in the article based on the X-ray transmission image generated by the X-ray transmission image generation unit, wherein
• the inspection unit
• performs a first inspection of using a predetermined threshold value to inspect whether the foreign matter having a lower attenuation rate of the X-rays than the article is included in the article,
• performs a second inspection of using a machine learning algorithm to inspect whether the foreign matter is included inside the article, and
• determines that the foreign matter is included in the article in case where the foreign matter common to inspection results of the first inspection and the second inspection is included in the article.