Inspection position identification method, three-dimensional image generation method, and inspection device
AssigneeSaki Corporation
InventorsTakuma Hirayama, Yosuke Yamamoto
Life of this patent
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AssigneeSaki Corporation
InventorsTakuma Hirayama, Yosuke Yamamoto
Estimating the term…
An inspection position identification method that allows accurate inspection to be performed without in-advance identification of the position of an inspection plane in an inspected target. A three-dimensional image generation method that allows generation of a three-dimensional image for inspection without in-advance identification of the position of an inspection plane in an inspected target and then allows inspection to be performed. An inspection device including the methods. An inspection device includes a storage unit, which stores a radiation transmission image of an inspected object and a three-dimensional image generated from the radiation transmission image, and a control unit. The process carried out by the control unit for identifying an inspection position in a three-dimensional image includes identifying the position of a transmission picture of the inspection position in the radiation transmission image and identifying the inspection position in the three-dimensional image from the position of the transmission picture.
An inspection device that inspects an inspected substrate using a three-dimensional image generated from a radiation transmission image of the inspected substrate, the device being characterized by comprising:
An inspection area identification method for identifying an inspection plane in a three-dimensional image generated from a radiation transmission image of an inspected substrate, the method being characterized by comprising:
Dependencies are inferred from the claim text.