Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process
AssigneeGeneral Electric Company
InventorsVladimir Anatolievich Lobastov, Adrian Ivan, David Charles Bogdan, Jr.
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Abstract
An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device.
Claims19
An additive manufacturing system comprising:
- a cabinet configured to enclose a component, said cabinet including a pinhole extending therethrough;
- an electron beam system configured to generate an electron beam directed toward the component, wherein interactions between the component and the electron beam generate x-ray radiation;
- at least one imaging device configured to detect the x-ray radiation through the pinhole;
- and
- a computing device configured to image the component based on the x-ray radiation detected by said at least one imaging device, wherein said at least one imaging device is configured to detect at least one of an air pocket defined within the component, a void defined within the component, and a crack defined within the component.
An additive manufacturing system comprising:
- a cabinet configured to enclose a component, said cabinet comprising a top side having a top surface, said top side defining at least one pinhole extending therethrough and an electron beam port extending therethrough;
- an electron beam system configured to generate an electron beam directed through the electron beam hole toward the component, said electron beam system positioned above said top surface and outside said cabinet, wherein interactions between the component and the electron beam generate x-ray radiation;
- and
- at least one imaging device configured to detect the x-ray radiation, said at least one imaging device positioned above said top surface and outside said cabinet, wherein the x-ray radiation is directed through the at least one pinhole toward said at least one imaging device, wherein said at least one imaging device is configured to detect at least one of an air pocket defined within the component, a void defined within the component, and a crack defined within the component.
A method of monitoring a component manufactured in an additive manufacturing system, said method comprising:
- directing an electron beam towards a build layer of the component positioned within a powder bed of the additive manufacturing system;
- detecting by at least one detector the x-ray radiation generated by interactions between the component and the electron beam;
- and
- determining at least one of a size and a depth of at least one of an air pocket defined within the component, a void defined within the component, and a crack defined within the component.
Dependencies are inferred from the claim text.