G01N 2223/641
Particle sizing
Official title: particle sizing
G01N2223/641 (Particle sizing) appears on 12 US grants and 16 published applications in this corpus.
Search patents in G01N- Granted patents
- 12
- Published applications
- 16
- Assignees
- 18
- Inventors
- 44
- Latest grant
- 7 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 1 | 1 |
| 2019 | 1 | 2 |
| 2020 | 1 | 2 |
| 2021 | 1 | 1 |
| 2022 | 2 | 3 |
| 2023 | 0 | 2 |
| 2024 | 1 | 1 |
| 2025 | 2 | 2 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Method for classifying unknown particles on a surface of a semi-conductor wafer7 Apr 2026US 12,596,062 B2Siltronic AG
- Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification16 Sep 2025US 12,417,645 B2FEI Company
- Particle size distribution measurement method, particle size distribution measurement device, and calculation device9 Sep 2025US 12,411,068 B2Hitachi High-Tech Corporation
- Particle beam experiment data analysis device28 May 2024US 11,994,454 B2Hitachi, Ltd.
- Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction26 Jul 2022US 11,397,154 B2
- Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification25 Dec 2025US 2025/0391182 A1FEI Company
- Bonding wire for semiconductor devices4 Dec 2025US 2025/0372565 A1Nippon Micrometal Corporation
- An x-ray fluorescence system21 Nov 2024US 2024/0385129 A1
- Method for classifying unknown particles on a surface of a semi-conductor wafer28 Dec 2023US 2023/0417644 A1Siltronic AG
- Particle size distribution measurement method, particle size distribution measurement device, and calculation device15 Jun 2023US 2023/0184656 A1Hitachi, Ltd.
Most cited
By later US patents
- Downhole sanding analysis tool6US 8,364,421 B2Schlumberger Technology Corporation · 2013
- Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction2US 11,397,154 B22022
- X-ray fluorescence spectrometer and X-ray fluorescence analyzing method2US 9,746,433 B2Rigaku Corporation · 2017
- Continuous, real time monitor for airborne depleted uranium particles in the respiratory range and corresponding method of use1US 10,031,060 B2Mauro & Associates, LLC · 2018
- Analyzing apparatus, analyzing method, and program1US 11,293,885 B2Horiba, Ltd. · 2022