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US 11,293,885 B2Granted
Analyzing apparatus, analyzing method, and program
AssigneeHoriba, Ltd.
InventorsYusuke Mizuno, Tomoki Aoyama, Erika Matsumoto
Life of this patent
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AssigneeHoriba, Ltd.
InventorsYusuke Mizuno, Tomoki Aoyama, Erika Matsumoto
Estimating the term…
An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).
An analyzing apparatus configured to analyze a measurement object on the basis of fluorescent X-rays generated from the measurement object, the apparatus comprising:
A method for analyzing a measurement object, the method comprising:
A non-transitory computer readable storage product having stored data representing a program causing a computer to perform a method for analyzing a measurement object on the basis of fluorescent X-rays generated from by the measurement object, the method comprising:
Dependencies are inferred from the claim text.