G01N 2223/601
Density profile
Official title: density profile
G01N2223/601 (Density profile) appears on 43 US grants and 52 published applications in this corpus.
Search patents in G01N- Granted patents
- 43
- Published applications
- 52
- Assignees
- 44
- Inventors
- 141
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 2 |
| 2009 | 1 | 1 |
| 2010 | 1 | 1 |
| 2011 | 0 | 1 |
| 2012 | 1 | 2 |
| 2013 | 0 | 2 |
| 2014 | 0 | 3 |
| 2015 | 2 | 2 |
| 2016 | 4 | 1 |
| 2017 | 3 | 2 |
| 2018 | 0 | 1 |
| 2019 | 1 | 7 |
| 2020 | 6 | 3 |
| 2021 | 5 | 7 |
| 2022 | 4 | 1 |
| 2023 | 1 | 5 |
| 2024 | 3 | 6 |
| 2025 | 5 | 3 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Bonding wire for semiconductor devices8 Sep 2026US 12,733,530 B2Nippon Micrometal Corporation
- Bonding wire for semiconductor devices25 Aug 2026US 12,721,208 B2Nippon Micrometal Corporation
- Systems and visualization methods for intraoperative volumetric imaging of tissue samples23 Dec 2025US 12,505,592 B2Clarix Imaging Corporation
- Evaluating performance method and system for elastic material19 Aug 2025US 12,392,697 B2Sumitomo Rubber Industries, Ltd.
- Method for capture of small-angle scatter over wide fields of view15 Jul 2025US 12,360,064 B1Duke University
- Systems and Visualization Methods for Intraoperative Volumetric Imaging of Tissue Samples18 Jun 2026US 2026/0170736 A1
- Generation of fused environmental and compositional information12 Feb 2026US 2026/0044645 A1Gamma Reality, Inc.
- System and method of cabinet radiography with video mirroring4 Sep 2025US 2025/0277760 A1Kub Technologies, Inc. Dba Kubtec
- Method for Capture of Small-Angle Scatter Over Wide Fields of View10 Jul 2025US 2025/0224350 A1Duke University
- Particle beam analyzer and particle beam analysis method27 Feb 2025US 2025/0067688 A1Hitachi, Ltd.
Most cited
By later US patents
- X-ray photoelectron emission spectrometry system47US 5,280,176 AThe United States of America as represented by the Secretary of Commerce · 1994
- X-ray inspection system and method38US 9,113,839 B2Rapiscon Systems, Inc. · 2015
- Log scanning37US 5,394,342 AMacMillan Bloedel Limited · 1995
- X-ray inspection system and method26US 9,442,082 B2Rapiscan Systems, Inc. · 2016
- Prompt gamma neutron activation analysis system22US 5,539,788 AWestinghouse Electric Corp. · 1996