G01N 2223/351
Prohibiting charge accumulation on sample substrate
Official title: prohibiting charge accumulation on sample substrate
G01N2223/351 (Prohibiting charge accumulation on sample substrate) appears on 7 US grants and 9 published applications in this corpus.
Search patents in G01N- Granted patents
- 7
- Published applications
- 9
- Assignees
- 7
- Inventors
- 17
- Latest grant
- 28 Jan 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 1 |
| 2022 | 1 | 2 |
| 2023 | 1 | 1 |
| 2024 | 1 | 1 |
| 2025 | 1 | 1 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Charged particle beam device28 Jan 2025US 12,211,665 B2Hitachi High-Tech Corporation
- Charged particle beam device12 Mar 2024US 11,929,231 B2Hitachi High-Tech Corporation
- Method for scanning a sample by a charged particle beam system23 May 2023US 11,658,004 B2ASML Netherlands B. V.
- Charged particle beam device17 May 2022US 11,335,533 B2Hitachi High-Tech Corporation
- Method for scanning a sample by a charged particle beam system21 Sep 2021US 11,127,563 B2ASML Netherlands B. V.
- Sample preparation system for electron microscopy8 Oct 2026US 2026/0309653 A1The Regents of the University of California
- Method and systems for balancing charges on a surface of an object comprising integrated circuit patterns in a scanning electron microscope27 Nov 2025US 2025/0364206 A1
- Charged Particle Beam Device13 Jun 2024US 2024/0194439 A1Hitachi High-Tech Corporation
- Coater for the preparation of carbon-based tape substrates for use in imaging applications14 Sep 2023US 2023/0286010 A1University of Kansas
- Charged Particle Beam Device4 Aug 2022US 2022/0246387 A1Hitachi High-Tech Corporation
Most cited
By later US patents