G01N 2223/345
Mathematical transformations on beams or signals
Official title: mathematical transformations on beams or signals, e.g. Fourier
G01N2223/345 (Mathematical transformations on beams or signals) appears on 24 US grants and 31 published applications in this corpus.
Search patents in G01N- Granted patents
- 24
- Published applications
- 31
- Assignees
- 34
- Inventors
- 82
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 2 |
| 2014 | 3 | 4 |
| 2015 | 1 | 0 |
| 2016 | 1 | 3 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 1 | 2 |
| 2020 | 1 | 0 |
| 2021 | 1 | 4 |
| 2022 | 2 | 1 |
| 2023 | 2 | 4 |
| 2024 | 1 | 2 |
| 2025 | 2 | 6 |
| 2026 | 3 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus for analyzing composition and method thereof6 Oct 2026US 12,754,152 B23I Solution Inc.
- Correction apparatus, system, method, and program30 Jun 2026US 12,669,450 B2Rigaku Corporation
- Measurement and determination of crystallographic texture with respect to position12 May 2026US 12,625,096 B2ROLLS-ROYCE plc
- Polarimetric coherent diffraction imaging28 Oct 2025US 12,455,236 B2Rensselaer Polytechnic Institute
- Detection and analysis method for rapid delineation of aging stages of styrene-butadiene-styrene modified asphalt15 Apr 2025US 12,276,605 B1Huazhong University of Science and Technology
- Method for detecting halogenated organic substances in landfill leachate and polluted water thereof4 Jun 2026US 2026/0153485 A1Chinese Research Academy of Environmental Sciences
- A method and apparatus for obtaining high-resolution x-ray analysis data28 May 2026US 2026/0146962 A1Malvern Panalytical Limited
- Measurement and determination of crystallographic texture with respect to position11 Sep 2025US 2025/0283841 A1ROLLS-ROYCE plc
- Method and system for full-field quantitative x-ray phase nanotomography using space-domain kramers-kronig relation4 Sep 2025US 2025/0277758 A1Korea Advanced Institute of Science and Technology
- Detection and analysis method for rapid delineation of aging stages of styrene-butadiene-styrene modified asphalt1 May 2025US 2025/0137925 A1Huazhong University of Science and Technology
Most cited
By later US patents
- Surface analysis method and apparatus24US 5,055,679 AHitachi, Ltd. · 1991
- Method of determining a given characteristic of a material sample17US 5,442,676 AU. S. Philips Corporation · 1995
- Apparatus for analyzing the spectral data in an elemental analyzer measuring gamma rays arising from neutron capture in bulk substances13US 4,171,485 AMDH Industries, Inc. · 1979
- Device for processing a measured signal corresponding to the intensity of X-rays reflected by a multi-layer structure on a substrate12US 5,457,727 AU. S. Philips Corporation · 1995
- Method and installation for the analysis by neutron activation of a flow of material in bulk10US 5,162,095 ACiments Lafarge S.A. · 1992