A method and apparatus for obtaining high-resolution x-ray analysis data

A processor for processing X-ray analysis data from an X-ray detector comprising a plurality of detection channels, the processor configured to:

• receive X-ray analysis data from the X-ray detector comprising the plurality of detection channels, the X-ray analysis data comprising intensity angular scan data obtained by measuring X-ray intensity while continuously scanning the X-ray detector through an angular scan range of the X-ray detector;
• obtain, for each detection channel, a sequence of intensity measurements, wherein the sequence of intensity measurements forms an intensity angular scan over the angular scan range of the X-ray detector;
• define a detection angle bin size for a plurality of detection angle bins;
• determine, for each detection channel, an angular offset;
• for each of the plurality of detection angle bins, determine, for each detection channel, an intensity contribution factor for at least one of the intensity measurements, wherein the intensity contribution factor is determined according to an angular range associated with the detection angle bin and the angular offset of the detection channel;
• and
• for each of the plurality of detection angle bins, determine a binned intensity based on the intensity of the at least one intensity measurement and its corresponding intensity contribution factor.