G01N 2223/102
Beta or electrons
Official title: beta or electrons
G01N2223/102 (Beta or electrons) appears on 78 US grants and 111 published applications in this corpus.
Search patents in G01N- Granted patents
- 78
- Published applications
- 111
- Assignees
- 66
- Inventors
- 297
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 1 | 0 |
| 2012 | 2 | 7 |
| 2013 | 3 | 1 |
| 2014 | 2 | 5 |
| 2015 | 5 | 3 |
| 2016 | 2 | 1 |
| 2017 | 2 | 3 |
| 2018 | 5 | 5 |
| 2019 | 5 | 5 |
| 2020 | 4 | 11 |
| 2021 | 8 | 13 |
| 2022 | 5 | 8 |
| 2023 | 8 | 6 |
| 2024 | 6 | 9 |
| 2025 | 5 | 15 |
| 2026 | 7 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Bonding wire for semiconductor devices8 Sep 2026US 12,733,530 B2Nippon Micrometal Corporation
- Analyzing method and analyzer19 May 2026US 12,631,578 B2JEOL Ltd.
- Method and system for orientating a sample for inspection with charged particle microscopy21 Apr 2026US 12,607,579 B2FEI Company
- Method to control gap for sheet manufacturing measurement processes14 Apr 2026US 12,601,590 B2Honeywell International Inc.
- Method for classifying unknown particles on a surface of a semi-conductor wafer7 Apr 2026US 12,596,062 B2Siltronic AG
- Sample preparation system for electron microscopy8 Oct 2026US 2026/0309653 A1The Regents of the University of California
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- High-speed ct scanner system with x-ray tube producing linear x-ray sources17 Sep 2026US 2026/0276564 A1Medichord LLC
- Crystal evaluation method17 Sep 2026US 2026/0282842 A1Kioxia Corporation
- Alloy composition calculation apparatus, method, program, and system27 Aug 2026US 2026/0251586 A1Resonac Corporation
Most cited
By later US patents
- Method of manufacturing a component124US 10,046,412 B2ROLLS-ROYCE plc · 2018
- Multiple-beam system for high-speed electron-beam inspection52US 8,362,425 B2KLA-Tencor Corporation · 2013
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles36US 4,393,311 ABell Telephone Laboratories, Incorporated · 1983
- Nano-level evaluation of kerogen-rich reservoir rock30US 9,869,649 B2Saudi Arabian Oil Company · 2018