G01N 2223/1003
Monochromatic
Official title: monochromatic
G01N2223/1003 (Monochromatic) appears on 17 US grants and 21 published applications in this corpus.
Search patents in G01N- Granted patents
- 17
- Published applications
- 21
- Assignees
- 19
- Inventors
- 47
- Latest grant
- 29 Apr 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 2 | 1 |
| 2014 | 0 | 2 |
| 2015 | 1 | 2 |
| 2016 | 2 | 2 |
| 2017 | 1 | 1 |
| 2018 | 1 | 0 |
| 2019 | 1 | 1 |
| 2020 | 1 | 0 |
| 2021 | 1 | 1 |
| 2022 | 1 | 3 |
| 2023 | 1 | 3 |
| 2024 | 1 | 1 |
| 2025 | 2 | 0 |
By publication year.
Recent patents
- Correction amount specifying apparatus, method, program, and jig29 Apr 2025US 12,287,301 B2Rigaku Corporation
- Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material25 Mar 2025US 12,259,342 B2Inversa Systems Ltd.
- X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate9 Jan 2024US 11,867,595 B2Industrial Technology Research Institute
- Non-destructive detection of surface and near surface abnormalities in a metallic product14 Nov 2023US 11,815,477 B2The University of Sheffield
- Multi-scan computed tomography defect detectability25 Oct 2022US 11,480,533 B1Honeywell Federal Manufacturing & Technologies, LLC
- Element distribution measuring device and element distribution measuring method18 Jul 2024US 2024/0241065 A1Hamamatsu Photonics K.K.
- System and Method of Measuring Contaminants in a Substantially Translucent Material, Such as Water6 Jul 2023US 2023/0213439 A1Hypersoniq B.V.
- Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material15 Jun 2023US 2023/0184700 A1Inversa Systems Ltd.
- Correction amount specifying apparatus, method, program, and jig18 May 2023US 2023/0152248 A1Rigaku Corporation
- Ph measurement method and ph measurement device22 Dec 2022US 2022/0404286 A1KYOCERA Corporation
Most cited
By later US patents
- Techniques for deriving tissue structure from multiple projection dual-energy x-ray absorptiometry55US 6,816,564 B2The Johns Hopkins University · 2004
- XRF system having multiple excitation energy bands in highly aligned package50US 8,559,597 B2X-Ray Optical Systems, Inc. · 2013
- X-ray interferometer33US 10,074,451 B2Csem Centre Suisse D'Electronique Et De Microtechnique SA—Recherche Et DéVeloppement · 2018
- Phase-sensitive X-ray imager24US 8,351,569 B2Lawrence Livermore National Security, LLC · 2013
- Multilayer targets for calibration and alignment of X-ray based measurement systems3US 10,816,486 B2KLA-Tencor Corporation · 2020