Non-destructive detection of surface and near surface abnormalities in a metallic product

A method of non-destructive detection of surface and near surface abnormalities in a metallic product, the method comprising:

• positioning a sample having a surface under a source of an incident radiation;
• irradiating the surface with the incident radiation from the source;
• detecting a scattered radiation;
• producing a radiation pattern from the detected scattered radiation;
• analysing the radiation pattern;
• producing an output indicative of the scattered radiation from the sample;
• comparing the output with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality;
• and
• identifying the presence of a surface abnormality when the output exceeds the threshold value,
• wherein said surface abnormality is one or more of a white layer, white etching layer, amorphous layer, and thermo-mechanically deformed region;
• and
• wherein said incident radiation includes at least one of X-ray radiation and neutron radiation.