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US 11,480,533 B1Granted
Multi-scan computed tomography defect detectability
AssigneeHoneywell Federal Manufacturing & Technologies, LLC
InventorBryan E. Schiefelbein
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AssigneeHoneywell Federal Manufacturing & Technologies, LLC
InventorBryan E. Schiefelbein
Estimating the term…
Systems and methods for representing internal defects of an object to determine defect detectability using a multi-scan computed tomography (CT) approach are disclosed. A defect-free object may be scanned using a CT machine. In one or more separate scans, phantom defects may be imaged and the resulting projections combined and reconstructed to represent internal defects. The air-normalized intensities of the object and the phantom defect may be used to represent voids and inclusions. Subtraction of materials may be represented by the quotient of the air-normalized intensities thereof, and the addition of materials may be represented by the product of the air-normalized intensities thereof. A void may be represented by subtracting a phantom defect scan from the object scan. An inclusion may be represented by creating a void, scanning an additional phantom defect, and adding the additional phantom defect in the volume created by the void.
A system for determining defect detectability of an object by representing internal defects in the object using computed tomography, the system comprising:
A method of determining defect detectability of an object by representing internal defects in the object using computed tomography, the method comprising:
One or more non-transitory computer-readable media storing computer-executable instructions that, when executed by at least one processor, perform a method of determining defect detectability of an object by representing internal defects in the object using computed tomography, comprising:
Dependencies are inferred from the claim text.