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US 8,351,569 B2Granted
Phase-sensitive X-ray imager
AssigneeLawrence Livermore National Security, LLC
InventorKevin Louis Baker
Life of this patent
Estimating the term…
Abstract
X-ray phase sensitive wave-front sensor techniques are detailed that are capable of measuring the entire two-dimensional x-ray electric field, both the amplitude and phase, with a single measurement. These Hartmann sensing and 2-D Shear interferometry wave-front sensors do not require a temporally coherent source and are therefore compatible with x-ray tubes and also with laser-produced or x-pinch x-ray sources.
Claims26
A method for producing a simulated reconstructed x-ray wavefront, comprising:
- propagating a first x-ray wavefront along an optical path defined from an x-ray source through a wavefront sensor element to a detector, wherein said detector detects a reference wavefront;
- inserting a sample into said optical path between said x-ray source and said wavefront sensor;
- propagating a second x-ray wavefront along said optical path and to said detector, wherein said detector detects a signal wavefront;
- calculating a phase gradient between said reference wavefront and said signal wavefront;
- simulating the propagation of said signal wavefront back to a simulated screen located at the position of said sample to produce a propagated wavefront;
- adjusting said propagated wavefront with a percentage of said phase gradient to produce an adjusted wavefront;
- simulating the propagation of said adjusted wavefront to said detector to produce a simulated signal wavefront;
- calculating a subsequent phase gradient between said signal wavefront and said simulated signal wavefront;
- simulating the propagation of said simulated signal wavefront back to said simulated screen to produce a second propagated wavefront;
- adjusting said second propagated wavefront with a percentage of said subsequent phase gradient to produce a second adjusted wavefront;
- simulating the propagation of said second adjusted wavefront to said detector to produce a reconstructed x-ray wavefront;
- and
- displaying said reconstructed x-ray wavefront.
10 more elements
An apparatus for producing a simulated reconstructed x-ray wavefront, comprising:
- an x-ray source or providing at least one of a first x-ray wavefront and a second x-ray wavefront;
- wavefront sensor element;
- a detector;
- wherein said x-ray source, said wavefront sensor element and said detector are aligned on an optical path defined from said x-ray source through said wavefront sensor element to said detector;
- and
- a computer system comprises a processor and display, wherein said processor comprises an algorithm for carrying out a series of steps comprising:
- calculating a phase gradient between a reference wavefront and a signal wavefront;
- simulating the propagation of said signal wavefront hack to a simulated screen located, at the position of said sample to produce a propagated wavefront;
- adjusting said propagated wavefront with a percentage of said phase gradient to produce an adjusted wavefront;
- simulating the propagation of said adjusted wavefront to said detector to produce a simulated signal wavefront;
- calculating a subsequent phase gradient between said signal wavefront and said simulated signal wavefront;
- simulating the propagation of said simulated signal wavefront back to said simulated screen to produce a second propagated wavefront;
- adjusting said second propagated wavefront with a percentage of said subsequent phase gradient to produce a second adjusted wavefront;
- and
- simulating the propagation of said second adjusted wavefront to said detector to produce a reconstructed x-ray wavefront.
12 more elements
Dependencies are inferred from the claim text.