G01N 2201/1211
For temperature
Official title: for temperature
G01N2201/1211 (For temperature) appears on 196 US grants and 243 published applications in this corpus.
Search patents in G01N- Granted patents
- 196
- Published applications
- 243
- Assignees
- 195
- Inventors
- 536
- Latest grant
- 2 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 3 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 2 | 0 |
| 1994 | 4 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 2 | 3 |
| 2005 | 6 | 5 |
| 2006 | 2 | 5 |
| 2007 | 1 | 7 |
| 2008 | 2 | 6 |
| 2009 | 6 | 2 |
| 2010 | 3 | 10 |
| 2011 | 4 | 6 |
| 2012 | 6 | 8 |
| 2013 | 1 | 12 |
| 2014 | 9 | 7 |
| 2015 | 7 | 6 |
| 2016 | 7 | 16 |
| 2017 | 12 | 9 |
| 2018 | 6 | 15 |
| 2019 | 21 | 10 |
| 2020 | 11 | 15 |
| 2021 | 10 | 15 |
| 2022 | 8 | 18 |
| 2023 | 12 | 22 |
| 2024 | 13 | 12 |
| 2025 | 16 | 17 |
| 2026 | 13 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Analyte sensor component2 Jun 2026US 12,642,462 B2SciLogica Corp.
- Pressure tuned infrared light emitting diode for downhole spectroscopy19 May 2026US 12,631,111 B2Baker Hughes Oilfield Operations LLC
- Optical sensor system19 May 2026US 12,631,548 B2Asahi Kasei Microdevices Corporation
- LED characterization and compensation methods and systems19 May 2026US 12,631,678 B2Cepheid
- Method for quality inspection of etching paste material based on spectral response difference12 May 2026US 12,625,070 B2
- Temperature-specific performance deviation correction apparatus and correction method for photosensor detecting nephelometric turbidity units1 Oct 2026US 2026/0297831 A1LG Electronics Inc.
- Systems and methods for determining crosstalk coefficients24 Sep 2026US 2026/0287498 A1Roche Sequencing Solutions, Inc.
- Optical analysis device3 Sep 2026US 2026/0259134 A1Ebara Jitsugyo Co., Ltd.
- Automatic Analysis Apparatus and Method of Adjusting Temperature of Photometer27 Aug 2026US 2026/0251556 A1Hitachi High-Tech Corporation
- Analysis device, program for analysis device, and analysis method27 Aug 2026US 2026/0251560 A1Horiba, Ltd.
Most cited
By later US patents
- Test card for performing assays209US 5,075,077 AAbbott Laboratories · 1991
- Test array for performing assays203US 5,281,540 AAbbott Laboratories · 1994
- Test element analysis system139US 6,880,968 B1Roche Diagnostics GmbH · 2005
- System and method for a self-calibrating non-invasive sensor129US 6,889,153 B22005
- Configurations, systems, and methods for optical scanning with at least one first relative angular motion and at least one second angular motion or at least one linear motion42US 7,423,750 B2Applera Corporation · 2008