G01N 2201/121
Correction signals
G01N2201/121 (Correction signals) appears on 376 US grants and 479 published applications in this corpus.
Search patents in G01N- Granted patents
- 376
- Published applications
- 479
- Assignees
- 327
- Inventors
- 1,091
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 8 | 0 |
| 1990 | 6 | 0 |
| 1991 | 6 | 0 |
| 1992 | 4 | 0 |
| 1993 | 5 | 0 |
| 1994 | 4 | 0 |
| 1995 | 2 | 0 |
| 1996 | 3 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 2 | 5 |
| 2005 | 7 | 6 |
| 2006 | 2 | 9 |
| 2007 | 3 | 8 |
| 2008 | 6 | 14 |
| 2009 | 9 | 8 |
| 2010 | 9 | 16 |
| 2011 | 5 | 13 |
| 2012 | 9 | 15 |
| 2013 | 9 | 16 |
| 2014 | 11 | 12 |
| 2015 | 11 | 21 |
| 2016 | 15 | 34 |
| 2017 | 20 | 18 |
| 2018 | 19 | 27 |
| 2019 | 36 | 19 |
| 2020 | 25 | 32 |
| 2021 | 16 | 23 |
| 2022 | 20 | 35 |
| 2023 | 19 | 38 |
| 2024 | 26 | 37 |
| 2025 | 30 | 34 |
| 2026 | 21 | 37 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optical systems and methods for biological analysis15 Sep 2026US 12,736,477 B2Life Technologies Corporation
- Defect inspection device8 Sep 2026US 12,730,065 B2Hitachi High-Tech Corporation
- Photonic integrated chip for spectroscopy4 Aug 2026US 12,699,044 B2Chamartin Laboratories LLC
- Far-infrared spectroscopic device, and far-infrared spectroscopic method14 Jul 2026US 12,680,953 B2Hitachi High-Tech Corporation
- Analyte sensor component2 Jun 2026US 12,642,462 B2SciLogica Corp.
- Temperature-specific performance deviation correction apparatus and correction method for photosensor detecting nephelometric turbidity units1 Oct 2026US 2026/0297831 A1LG Electronics Inc.
- Systems and methods for determining crosstalk coefficients24 Sep 2026US 2026/0287498 A1Roche Sequencing Solutions, Inc.
- Defect Inspection System17 Sep 2026US 2026/0276558 A1Hitachi High-Tech Corporation
- Optical analysis device3 Sep 2026US 2026/0259134 A1Ebara Jitsugyo Co., Ltd.
- Automatic Analysis Apparatus and Method of Adjusting Temperature of Photometer27 Aug 2026US 2026/0251556 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Signal processing method and apparatus721US 5,379,238 A1995
- Test card for performing assays209US 5,075,077 AAbbott Laboratories · 1991
- Test array for performing assays203US 5,281,540 AAbbott Laboratories · 1994
- Test element analysis system139US 6,880,968 B1Roche Diagnostics GmbH · 2005
- System and method for a self-calibrating non-invasive sensor129US 6,889,153 B22005