G01N 2201/1087
Focussed scan beam
Official title: Focussed scan beam, e.g. laser
G01N2201/1087 (Focussed scan beam) appears on 35 US grants and 28 published applications in this corpus.
Search patents in G01N- Granted patents
- 35
- Published applications
- 28
- Assignees
- 37
- Inventors
- 106
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 1 | 0 |
| 1990 | 3 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 3 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 1 | 0 |
| 2012 | 1 | 2 |
| 2013 | 2 | 2 |
| 2014 | 1 | 0 |
| 2015 | 1 | 2 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 0 | 2 |
| 2019 | 1 | 0 |
| 2020 | 3 | 3 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 1 |
| 2024 | 1 | 3 |
| 2025 | 2 | 5 |
| 2026 | 4 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Plasmonic device29 Sep 2026US 12,748,049 B2Ostia Technologies Limited
- Optical scanning system for non-destructively acquiring three-dimensional structure of object1 Sep 2026US 12,723,989 B2Opxion Technology Inc.
- Assessment of utility components using airborne remote sensing1 Sep 2026US 12,723,993 B2Florida Power & Light Company
- Surface inspection system28 Jul 2026US 12,693,241 B2Onto Innovation Inc.
- Microscope for imaging samples within wells of multi-well plates hold by stage and beam homogenizer for homogenizing beam23 Sep 2025US 12,422,660 B2Quiver Holdings Inc.
- Stroboscopic high-throughput imaging system23 Jul 2026US 2026/0210861 A1Staker Scientific, Inc.
- Focus tracking techniques for inspection system25 Jun 2026US 2026/0177495 A1Onto Innovation Inc.
- Universal gemstone cut identification device and method18 Jun 2026US 2026/0168935 A1Max Planck Postech/Korea Research Initiative
- Microscope with spatial imaging and beam homogenizer1 Jan 2026US 2026/0003178 A1Quiver Holdings Inc.
- Assessment of utility components using airborne remote sensing25 Dec 2025US 2025/0389673 A1Florida Power & Light Company
Most cited
By later US patents
- Apparatus and a method for high numerical aperture microscopic examination of materials158US 5,220,403 AInternational Business Machines Corporation · 1993
- Fluorometer114US 4,877,965 ADiatron Corporation · 1989
- Apparatus and a method for high numerical aperture microscopic examination of materials102US 5,208,648 AInternational Business Machines Corporation · 1993
- Particle detection method including comparison between sequential scans100US 4,766,324 ATencor Instruments · 1988
- Evaluating both thickness and compositional variables in a thin film sample74US 4,679,946 ATherma-Wave, Inc. · 1987