G01N 2201/105
Purely optical scan
G01N2201/105 (Purely optical scan) appears on 199 US grants and 254 published applications in this corpus.
Search patents in G01N- Granted patents
- 199
- Published applications
- 254
- Assignees
- 163
- Inventors
- 555
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 8 |
| 2007 | 2 | 6 |
| 2008 | 2 | 1 |
| 2009 | 6 | 1 |
| 2010 | 2 | 9 |
| 2011 | 3 | 3 |
| 2012 | 2 | 3 |
| 2013 | 6 | 5 |
| 2014 | 9 | 9 |
| 2015 | 8 | 28 |
| 2016 | 19 | 17 |
| 2017 | 17 | 25 |
| 2018 | 24 | 10 |
| 2019 | 9 | 15 |
| 2020 | 15 | 17 |
| 2021 | 14 | 10 |
| 2022 | 5 | 7 |
| 2023 | 9 | 12 |
| 2024 | 6 | 20 |
| 2025 | 19 | 25 |
| 2026 | 15 | 21 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Apparatus for illuminating matter29 Sep 2026US 12,746,580 B2Tomra Sorting GmbH
- System, robot and method for measuring the color of an area of a sample or of a vehicle's part29 Sep 2026US 12,748,040 B2Fyla Laser, S. L.
- Apparatus and method for measuring wafers4 Aug 2026US 12,699,058 B2Precitec Optronik GmbH
- FTIR-based sensor system for monitoring gas, vapor, or fluid emissions14 Jul 2026US 12,680,950 B2Lightsense Technology, Inc.
- Cat's-eye swept source laser for oct and spectroscopy26 May 2026US 12,638,387 B2KineoLabs, Inc.
- Wafer inspection system and method thereof24 Sep 2026US 2026/0287520 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Rgb camera scanned illumination17 Sep 2026US 2026/0276529 A1Tomra Sorting GmbH
- Defect Inspection System17 Sep 2026US 2026/0276558 A1Hitachi High-Tech Corporation
- Cat's-eye swept source laser for OCT and spectroscopy27 Aug 2026US 2026/0251565 A1
- Sample measurement device and sample measurement method27 Aug 2026US 2026/0251574 A1Hamamatsu Photonics K.K.
Most cited
By later US patents
- Non-ionizing imager92US 9,084,535 B2King's College London · 2015
- Apparatuses and methods for anomalous gas concentration detection55US 11,112,308 B2Bridger Photonics, Inc. · 2021
- Foreign particle detecting method and apparatus52US 4,669,875 AHitachi, Ltd. · 1987
- Photothermal test process, apparatus for performing the process and heat microscope34US 5,118,945 ASiemens Aktiengesellschaft · 1992
- Tomographic phase microscopy34US 8,848,199 B2Massachusetts Institute of Technology · 2014