G01N 2201/0675
Slm
G01N2201/0675 (Slm) appears on 106 US grants and 122 published applications in this corpus.
Search patents in G01N- Granted patents
- 106
- Published applications
- 122
- Assignees
- 95
- Inventors
- 285
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 0 |
| 2004 | 0 | 2 |
| 2005 | 2 | 0 |
| 2006 | 1 | 3 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 2 |
| 2010 | 1 | 4 |
| 2011 | 1 | 4 |
| 2012 | 0 | 7 |
| 2013 | 3 | 2 |
| 2014 | 4 | 2 |
| 2015 | 4 | 6 |
| 2016 | 7 | 13 |
| 2017 | 7 | 10 |
| 2018 | 9 | 9 |
| 2019 | 12 | 10 |
| 2020 | 11 | 13 |
| 2021 | 8 | 4 |
| 2022 | 5 | 6 |
| 2023 | 9 | 4 |
| 2024 | 5 | 8 |
| 2025 | 6 | 5 |
| 2026 | 5 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Stimulated Raman scattering tomography system and method11 Aug 2026US 12,704,461 B2National University of Singapore
- Sensor system and method for sensing a physical quantity16 Jun 2026US 12,657,662 B2Rohde & Schwarz GmbH & Co.KG
- Luminescence microscope for imaging a sample or for localizing or tracking emitters in a sample19 May 2026US 12,631,863 B2Abberior Instruments GmbH
- Methods, systems and kits for in-pen assays28 Apr 2026US 12,611,671 B2Bruker Cellular Analysis, Inc.
- Pupil image measuring device and method17 Mar 2026US 12,578,178 B2Samsung Electronics Co., Ltd.
- A device for analysis of a test object using photo-acoustic effect and a method for controlling inducing of a photo-acoustic effect30 Jul 2026US 2026/0219237 A1Imec Vzw
- Spatially modulated illumination device21 May 2026US 2026/0140057 A1Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Methods, Systems and Kits for In-Pen Assays9 Apr 2026US 2026/0097402 A1Bruker Cellular Analysis, Inc.
- Defect detection in packaging application5 Mar 2026US 2026/0068602 A1APPLIED Materials.Inc.
- Wafer inspection apparatus19 Feb 2026US 2026/0049950 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Real time optical correlation system299US 5,327,286 ATexas Instruments Incorporated · 1994
- SLM spectrometer153US 5,504,575 ATexas Instruments Incorporated · 1996
- Particle detection method and apparatus53US 5,805,278 AInspex, Inc. · 1998
- Near real time optical phase conjugation41US 8,451,450 B2Bio-Rad Laboratories, Inc. · 2013
- Method and apparatus for detecting particles on a surface of a semiconductor wafer having repetitive patterns37US 5,659,390 AInspex, Inc. · 1997