G01N 2021/887
The measurements made in two or more directions, angles, positions
Official title: {the measurements made in two or more directions, angles, positions}
G01N2021/887 (The measurements made in two or more directions, angles, positions) appears on 53 US grants and 55 published applications in this corpus.
Search patents in G01N- Granted patents
- 53
- Published applications
- 55
- Assignees
- 49
- Inventors
- 140
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 4 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 2 |
| 2003 | 0 | 0 |
| 2004 | 0 | 3 |
| 2005 | 1 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 3 | 4 |
| 2010 | 2 | 4 |
| 2011 | 3 | 1 |
| 2012 | 3 | 2 |
| 2013 | 2 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 1 | 1 |
| 2017 | 0 | 1 |
| 2018 | 3 | 1 |
| 2019 | 1 | 1 |
| 2020 | 3 | 3 |
| 2021 | 2 | 7 |
| 2022 | 5 | 6 |
| 2023 | 3 | 0 |
| 2024 | 4 | 5 |
| 2025 | 2 | 3 |
| 2026 | 4 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Lock-in averaging for semiconductor diagnostics6 Oct 2026US 12,754,145 B2Imec Vzw
- Measurement deviation analysis for a semiconductor specimen10 Mar 2026US 12,571,739 B2Applied Materials Israel Ltd.
- Visual inspection apparatus and visual inspection method17 Feb 2026US 12,553,833 B2Hitachi Astemo, Ltd.
- Information processing apparatus, information processing method, and non-transitory computer-readable storage medium13 Jan 2026US 12,523,616 B2Canon Kabushiki Kaisha
- Laser scanning of cable and cable accessory components subjected to mechanical loads and elastic or inelastic deformation2 Dec 2025US 12,487,189 B2Nexans
- Inspection system and inspection module11 Jun 2026US 2026/0160702 A1Wnc Corporation
- Variably switched uniform and striped lighting panel30 Apr 2026US 2026/0117948 A1Fyusion, Inc.
- Specialized lighting configuration for projection of striped lighting30 Apr 2026US 2026/0118279 A1Fyusion, Inc.
- Product inspection system and product inspection method30 Apr 2026US 2026/0118281 A1Daiichi Jitsugyo Viswill Co., Ltd.
- Generation and assessment of striped lighting illuminated damage detection data30 Apr 2026US 2026/0120265 A1Fyusion, Inc.
Most cited
By later US patents
- Two-phase optical inspection method and apparatus for defect detection177US 5,699,447 AOrbot Instruments Ltd. · 1997
- Substrate inspection method and apparatus100US 6,178,257 B1APPLIED Materials.Inc. · 2001
- Optical inspection method and apparatus62US 5,982,921 AAPPLIED Materials.Inc. · 1999
- Defect inspecting apparatus using multiple color light to detect defects60US 5,072,128 ANikon Corporation · 1991
- Computer controlled, multiple angle illumination system51US 5,185,638 AInternational Business Machines Corporation · 1993