Product inspection system and product inspection method
AssigneesUshio Denki Kabushiki Kaisha, Daiichi Jitsugyo Viswill Co., Ltd.
InventorsKoji NAKAYAMA, Masaya FUJIMOTO, Katsuya WATANABE, Junki SAHARA
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Abstract
A product inspection system includes a spectrum measurer that measures a spectrum of a product being conveyed, and a quality determiner that determines quality of the product on the basis of output obtained by inputting spectral data of the product measured by the spectrum measurer into a trained model generated by machine learning. The trained model is generated by machine learning using training data including spectral data measured in mutually different postures.
Claims10
A product inspection system comprising:
- a spectrum measurer structured to measure a spectrum of a product being conveyed;
- and
- a quality determiner structured to determine quality of the product on the basis of output obtained by inputting spectral data of the product measured by the spectrum measurer into a trained model generated by machine learning,
- wherein the trained model is generated by machine learning using training data including spectral data measured in mutually different postures.
A product inspection method comprising:
- a step of measuring a spectrum of a product being conveyed;
- and
- a step of determining quality of the product on the basis of output obtained by inputting measured spectral data of the product into a trained model generated by machine learning,
- wherein the trained model is generated by machine learning using training data including spectral data measured in mutually different postures.
Dependencies are inferred from the claim text.