G01N 2021/8845
Multiple wavelengths of illumination or detection
Official title: {Multiple wavelengths of illumination or detection}
G01N2021/8845 (Multiple wavelengths of illumination or detection) appears on 272 US grants and 358 published applications in this corpus.
Search patents in G01N- Granted patents
- 272
- Published applications
- 358
- Assignees
- 217
- Inventors
- 853
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 5 |
| 2002 | 1 | 4 |
| 2003 | 8 | 3 |
| 2004 | 2 | 3 |
| 2005 | 5 | 8 |
| 2006 | 3 | 2 |
| 2007 | 2 | 4 |
| 2008 | 4 | 4 |
| 2009 | 2 | 2 |
| 2010 | 0 | 5 |
| 2011 | 2 | 3 |
| 2012 | 5 | 5 |
| 2013 | 3 | 7 |
| 2014 | 11 | 12 |
| 2015 | 4 | 9 |
| 2016 | 3 | 17 |
| 2017 | 18 | 10 |
| 2018 | 11 | 20 |
| 2019 | 19 | 26 |
| 2020 | 21 | 18 |
| 2021 | 13 | 25 |
| 2022 | 17 | 27 |
| 2023 | 18 | 37 |
| 2024 | 26 | 42 |
| 2025 | 37 | 40 |
| 2026 | 21 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor measurement apparatus15 Sep 2026US 12,736,479 B2Samsung Electronics Co., Ltd.
- Method and apparatus for inspecting full containers1 Sep 2026US 12,723,990 B2Heuft Systemtechnik GmbH
- Tablet spectroscopic measurement method25 Aug 2026US 12,716,851 B2Ushio Denki Kabushiki Kaisha
- Optical inspection method, non-transitory storage medium, and optical inspection apparatus18 Aug 2026US 12,710,356 B2Kabushiki Kaisha Toshiba
- Method of hyperspectral imaging using lamp with double-walled housing18 Aug 2026US 12,710,374 B2Parata Systems, LLC
- Shape inspection method for inspection-target object24 Sep 2026US 2026/0287336 A1Mitsubishi Electric Corporation
- Surface inspection systems and methods20 Aug 2026US 2026/0243669 A1The Boeing Company
- System and method for illumination of an imaged scene using a programmable light source13 Aug 2026US 2026/0235931 A1Cognex Corporation
- Road surface condition detection apparatus and method for operating thereof30 Jul 2026US 2026/0219199 A1
- Simultaneous, Multiple Channel Measurements Of Semiconductor Structures At Different Nominal Azimuth Angles23 Jul 2026US 2026/0210868 A1
Most cited
By later US patents
- Systems and methods for providing illumination in machine vision systems300US 6,624,597 B2Color Kinetics Incorporated · 2003
- Sample inspection system235US 6,201,601 B1KLA-Tencor Corporation · 2001
- Video inspection system employing multiple spectrum LED illumination99US 5,365,084 APressco Technology Inc. · 1994
- Engineered lighting system for TDI inspection comprising means for controlling lighting elements in accordance with specimen displacement84US 5,172,005 APressco Technology Inc. · 1992
- Method and apparatus for inspection of solder joints utilizing shape determination from shading79US 5,064,291 AHughes Aircraft Company · 1991