G01N 2021/8829
Shadow projection or structured background
Official title: {Shadow projection or structured background, e.g. for deflectometry}
G01N2021/8829 (Shadow projection or structured background) appears on 133 US grants and 155 published applications in this corpus.
Search patents in G01N- Granted patents
- 133
- Published applications
- 155
- Assignees
- 119
- Inventors
- 355
- Latest grant
- 17 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 5 | 0 |
| 2002 | 2 | 1 |
| 2003 | 4 | 1 |
| 2004 | 1 | 2 |
| 2005 | 1 | 0 |
| 2006 | 2 | 3 |
| 2007 | 0 | 1 |
| 2008 | 1 | 5 |
| 2009 | 2 | 1 |
| 2010 | 3 | 5 |
| 2011 | 1 | 1 |
| 2012 | 1 | 3 |
| 2013 | 1 | 2 |
| 2014 | 6 | 3 |
| 2015 | 2 | 5 |
| 2016 | 5 | 6 |
| 2017 | 4 | 10 |
| 2018 | 4 | 12 |
| 2019 | 13 | 16 |
| 2020 | 16 | 14 |
| 2021 | 10 | 10 |
| 2022 | 9 | 14 |
| 2023 | 7 | 6 |
| 2024 | 11 | 14 |
| 2025 | 9 | 9 |
| 2026 | 2 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method and apparatus to enhance semiconductor device manufacturing17 Mar 2026US 12,581,754 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Visual inspection apparatus and system associated therewith10 Feb 2026US 12,546,723 B2Rinnovision Inc.
- Method and device for detecting local defects on a reflective surface11 Nov 2025US 12,467,872 B2Isra Vision AG
- Optical inspection method and storage medium, and optical inspection apparatus that uses the same23 Sep 2025US 12,422,381 B2Kabushiki Kaisha Toshiba
- Vehicle imaging station26 Aug 2025US 12,401,918 B2Degould Limited
- Method for contactless in-line inspection of containers, and station for implementing same30 Jul 2026US 2026/0219204 A1Tiama
- Optical apparatus for three-dimensional nanostructure measurement and inspection, three-dimensional nanostructure measurement and inspection apparatus including the same, and three-dimensional nanostructure measurement and inspection method23 Jul 2026US 2026/0210870 A1Samsung Electronics Co., Ltd.
- Optical detection system and method for semiconductor substrates2 Jul 2026US 2026/0185949 A1Spirox, Inc.
- Method and apparatus to enhance semiconductor device manufacturing2 Jul 2026US 2026/0190511 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Variably switched uniform and striped lighting panel30 Apr 2026US 2026/0117948 A1Fyusion, Inc.
Most cited
By later US patents
- Device and method for the determination of the quality of structured surfaces53US 6,542,248 B1BYK Gardner GmbH · 2003
- Method of and apparatus for inspecting transparent object for defect44US 5,216,481 AToyo Glass Co., Ltd. · 1993
- Image pickup and processing device and method thereof39US 6,285,787 B1OMRON Corporation · 2001
- Field test unit for windscreen optical evaluation35US 4,310,242 AThe United States of America as represented by the Secretary of the Air Force · 1982
- Surface defect inspection system and method34US 6,462,813 B1Perceptron, Inc. · 2002