Method and device for detecting local defects on a reflective surface
AssigneeIsra Vision AG
InventorKlaus Veit
Life of this patent
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Abstract
A method for detecting local defects on a reflective surface with a device having at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit. The pattern has at least one substantially linear light-dark transition, the positioning and orientation of the camera are known, the camera captures the pattern reflected on the surface and generates image data of the reflected pattern which are transmitted by the camera to the data processing unit, and the data processing unit determines local defects on the surface on the basis of an evaluation of at least one property of the at least one light-dark transition in the image data of the reflected pattern. Also a device and a computer program.
Claims11
A method for detecting local defects on a reflective surface with a device comprising at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit, wherein the at least one pattern comprises at least one line-shaped light-dark transition, and wherein a position and orientation of the at least one camera being known, wherein the method comprises:
- recording, by the at least one camera, a reflected pattern on the reflective surface and generating image data of the reflected pattern;
- transmitting the image data from the at least one camera to the data processing unit;
- and,
- determining, by the at least one data processing unit, one or more local defects on the reflective surface based on an evaluation of at least one property of the at least one line-shaped light-dark transition in the image data of the reflected pattern,
- wherein the at least one property of the at least one line-shaped light-dark transition in the image data comprises a contrast in a predetermined area of the at least one line-shaped light-dark transition in the image data.
A device for detecting local defects on a reflective surface comprising:
- at least one pattern for reflection on the reflective surface,
- at least one camera, and
- a data processing unit,
- wherein the at least one pattern comprises at least one line-shaped light-dark transition,
- wherein a positioning and an orientation of the at least one camera are known,
- wherein the camera is configured to record a reflected pattern on the reflective surface, generate image data of the reflected pattern, and transmit the image data to the data processing unit, and,
- wherein the data processing unit is configured to determine local defects on the reflective surface based on an evaluation of at least one property of the at least one line-shaped light-dark transition in the image data of the reflected pattern,
- wherein the at least one property of the at least one line-shaped light-dark transition in the image data comprises a contrast in a predetermined area of the at least one line-shaped light-dark transition in the image data.
Dependencies are inferred from the claim text.