Device and method for the determination of the quality of structured surfaces
AssigneeBYK Gardner GmbH
InventorPeter Schwarz
Life of this patent
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Abstract
The present invention relates to a device for a quantified determination of the quality of structured surfaces comprising a first optical device that emits light at a predetermined angle onto the surface to be measured and a second optical device having at least one photo sensor which receives the light reflected by the measurement surface. The optical device are configured such that the reflected light is influenced by the structure of the measurement surface and the reflected light is evaluated by an evaluator, which is provided for controlling the measurement sequence and which comprises a processor and a controller where at least one structural variable is derived therefrom which is characteristic of at least one structural-contingent property of the surface.
Claims78
A device for a quantified determination of the quality of structured surfaces comprising:
- a first optical means having at least one light source with light emitting therefrom being directed at a predetermined angle onto a measurement surface which is a portion of a surface to be measured, the measurement surface having at least a first surface section and a second surface section exhibiting a different visual characteristic dependent on the structure of said surface to be measured;
- a second optical means arranged at a predetermined angle to said measurement surface for receiving the light reflected from said measurement surface, whereby said second optical means has at least one photo sensor having at least one light-sensitive surface, whereby said at least one photo sensor emits an electrical measurement signal that is characteristic for said reflected light;
- evaluation means having at least one processor means and at least one memory means;
- an output means;
- wherein said first optical means and said second optical means are disposed such that said reflected light is influenced by the structure of said measurement surface;
- wherein a characteristic visual parameter of said measurement surface is determinable for said first and second surface sections;
- and
- wherein said evaluation means evaluates said reflected light and derives therefrom at least one structural parameter that is representative of at least one structure dependent characteristic of said surface to be measured.
A method for a quantified determination of the quality of structured surfaces with the application of a device, said method comprising:
- directing light with a first optical means having a first light source at a predetermined angle onto a measurement surface to be measured, wherein said measurement surface has at least a first surface section and a second surface section exhibiting a different visual characteristic dependent on the structure of said measurement surface;
- receiving light reflected from said measurement surface with a second optical means having at least one photo sensor that is oriented at a second predetermined angle to said measurement surface, whereby said at least one photo sensor emits an electrical measurement signal that is characteristic for said received light,
- controlling with an evaluation means a measuring process sequence with at least one processor means and storing said electrical measurement signal in a memory means,
- issuing with an output means a measurement result,
- wherein for each of said at least two surface sections a characteristic visual parameter of said measurement surface is determined;
- and
- evaluating with said evaluation means said reflected light and deriving therefrom at least one structural parameter that characterizes the structure dependent characteristic of the surface.
Dependencies are inferred from the claim text.