G01N 2021/8809
Adjustment for highlighting flaws
Official title: {Adjustment for highlighting flaws}
G01N2021/8809 (Adjustment for highlighting flaws) appears on 87 US grants and 107 published applications in this corpus.
Search patents in G01N- Granted patents
- 87
- Published applications
- 107
- Assignees
- 68
- Inventors
- 232
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 8 |
| 2007 | 1 | 3 |
| 2008 | 2 | 1 |
| 2009 | 5 | 1 |
| 2010 | 2 | 5 |
| 2011 | 2 | 0 |
| 2012 | 1 | 3 |
| 2013 | 3 | 3 |
| 2014 | 1 | 3 |
| 2015 | 3 | 4 |
| 2016 | 6 | 3 |
| 2017 | 3 | 3 |
| 2018 | 5 | 11 |
| 2019 | 8 | 3 |
| 2020 | 4 | 6 |
| 2021 | 4 | 6 |
| 2022 | 3 | 7 |
| 2023 | 7 | 6 |
| 2024 | 7 | 11 |
| 2025 | 7 | 11 |
| 2026 | 10 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Car body inspection device, car body inspection system, and car body inspection method14 Jul 2026US 12,680,962 B2Ricoh Company, Ltd.
- Machine vision system utilizing autofocus and inspection processes14 Jul 2026US 12,680,963 B2Mitutoyo Corporation
- Detection system and method, computer device, and computer readable storage medium14 Jul 2026US 12,680,997 B2Reemoon Technology Co., Ltd.
- High-speed automatic film-foreign substance detection apparatus30 Jun 2026US 12,669,445 B2
- Outdoor photoluminescence imaging of photovoltaic arrays via optical string modulation19 May 2026US 12,633,872 B2NewSouth Innovations Pty Limited
- Surface inspection systems and methods20 Aug 2026US 2026/0243669 A1The Boeing Company
- Defect inspection device and defect inspection method20 Aug 2026US 2026/0243702 A1Hitachi High-Tech Corporation
- Optical apparatus for three-dimensional nanostructure measurement and inspection, three-dimensional nanostructure measurement and inspection apparatus including the same, and three-dimensional nanostructure measurement and inspection method23 Jul 2026US 2026/0210870 A1Samsung Electronics Co., Ltd.
- Inspection equipment and inspection method11 Jun 2026US 2026/0160699 A1Samsung Display Co., Ltd.
- Apparatus for and method of analyzing coated state of electrode plate of secondary battery14 May 2026US 2026/0134531 A1Samsung SDI.Co., Ltd.
Most cited
By later US patents
- Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet37US 5,087,822 AAlcan International Limited · 1992
- System and method for inspecting a workpiece surface using surface structure spatial frequencies26US 7,286,218 B2KLA-Tencor Technologies Corporation · 2007
- System and method for signal processing for a workpiece surface inspection system18US 7,505,125 B2KLA-Tencor Corporation · 2009
- System and method for controlling light scattered from a workpiece surface in a surface inspection system16US 7,417,722 B2KLA-Tencor Technologies Corporation · 2008
- Apparatus for generating data for determining a property of a gemstone14US 7,411,663 B2Overseas Diamonds Technologies · 2008