Apparatus for and method of analyzing coated state of electrode plate of secondary battery

A method of analyzing a coated state of an electrode plate of a secondary battery, the method comprising:

• acquiring, using a processor, a target image from an image acquisition module, wherein the image acquisition module is configured to acquire the target image including a first image and a second image of a first surface and a second surface of an electrode plate, respectively, with a first coating material and a second coating material being located on the first and second surfaces of the electrode plate, respectively, and with the marker generation module generating markers that are overlaid on the first and second surfaces of the electrode plate, and a first coating material and a second coating material are located on the first and second surfaces of the electrode plate, respectively;
• analyzing, using the processor, the first and second images included in the target image;
• and
• determining a mismatch between coating properties of the first coating material on the first surface of the electrode plate and coating properties of the second coating material on the second surface of the electrode plate.

An apparatus for analyzing a coated state of an electrode plate of a secondary battery, with a first coating material and a second coating material being located on first and second surfaces of the electrode plate, respectively, the apparatus comprising:

• a first marker generation module configured to be disposed on a first side of an electrode plate;
• a first image acquisition module configured to be disposed on the first side of the electrode plate and to acquire a first target image including an image of a first area of the first surface and an image of a first area of the second surface, respectively, wherein markers generated by the first marker generation module are respectively overlaid on the first area of the first surface and the first area of the second surface of the electrode plate, and the first coating material and the second coating material are located on the first and second surfaces of the electrode plate, respectively;
• a second marker generation module configured to be disposed on a second side of the electrode plate;
• a second image acquisition module configured to be disposed on the second side of the electrode plate and to acquire a second target image including an image of a second area of the first surface and an image of a second area of the second surface, respectively, wherein markers generated by the second marker generation module are overlaid on the second area of the first surface and the second area of the second surface of the electrode plate;
• and
• a processor,
• wherein the processor is configured to:
• i) determine a mismatch between coating properties of the first coating material in the first area of the first surface of the electrode plate and coating properties of the second coating material in the first area of the second surface of the electrode plate by analyzing the first target image using the markers on the first target image,
• ii) determine a mismatch between the coating properties of the first coating material in the second area of the first surface of the electrode plate and the coating properties of the second coating material in the second area of the second surface of the electrode plate by analyzing the second target image using the markers on the second target image,
• iii) determine a mismatch between the coating properties of the first coating material in the first area of the first surface of the electrode plate and the coating properties of the first coating material in the second area of the first surface of the electrode plate using the markers on the first and second target images, or
• iv) determine a mismatch between the coating properties of the second coating material in the first area of the second surface of the electrode plate and the coating properties of the second coating material in the second area of the second surface of the electrode plate using the markers on the first and second target images.