G01N 2021/473
Compensating for unwanted scatter
Official title: {Compensating for unwanted scatter, e.g. reliefs, marks}
G01N2021/473 (Compensating for unwanted scatter) appears on 26 US grants and 29 published applications in this corpus.
Search patents in G01N- Granted patents
- 26
- Published applications
- 29
- Assignees
- 26
- Inventors
- 72
- Latest grant
- 1 Sep 2026
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| 2016 | 1 | 5 |
| 2017 | 3 | 2 |
| 2018 | 6 | 4 |
| 2019 | 3 | 3 |
| 2020 | 0 | 0 |
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| 2022 | 1 | 1 |
| 2023 | 1 | 3 |
| 2024 | 2 | 1 |
| 2025 | 0 | 1 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Optical measurement device and optical measurement method1 Sep 2026US 12,723,975 B2Hamamatsu Photonics K.K.
- Sensor device to mitigate the effects of unwanted signals made in optical measurements of biological properties26 May 2026US 12,635,894 B2Biobeat Technologies Ltd.
- Relating to a device for imaging26 May 2026US 12,638,392 B2Panacea Diagnostics Ltd
- Optical measurement device and optical measurement method19 Nov 2024US 12,146,831 B2Hamamatsu Photonics K.K.
- Adjusted color prescriptions for aqueous coating compositions to correct gloss differences23 Apr 2024US 11,965,782 B2Columbia Insurance Company
- Improvements in or relating to a device for imaging13 Mar 2025US 2025/0085221 A1Panacea Diagnostics Ltd
- Adjusted Color Prescriptions for Aqueous Coating Compositions to Correct Gloss Differences18 Apr 2024US 2024/0125650 A1
- Sensor device to mitigate the effects of unwanted signals made in optical measurements of biological properties6 Jul 2023US 2023/0210390 A1Biobeat Technologies Ltd.
- Optical measurement device and optical measurement method20 Apr 2023US 2023/0124033 A1Hamamatsu Photonics K.K.
- Optical measurement device and optical measurement method20 Apr 2023US 2023/0124819 A1Hamamatsu Photonics K.K.
Most cited
By later US patents
- Method and apparatus for reducing or eliminating stray light in an optical test head71US 7,375,362 B2WD Media, LLC · 2008
- Method for detecting foreign matter and device for realizing same63US 5,046,847 AHitachi, Ltd. · 1991
- Inspection method and inspection device20US 7,777,876 B2Hitachi High-Technologies Corporation · 2010
- Method and apparatus for detecting foreign particle19US 4,965,454 AHitachi, Ltd. · 1990
- Inspection method and inspection device12US 9,007,581 B2Hitachi High-Technologies Corporation · 2015