Optical measurement device and optical measurement method
AssigneeHamamatsu Photonics K.K.
InventorsNaoki Iwata, Fusanori Kondo, Tomokazu Matsumura, Teruo Takeshita
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AssigneeHamamatsu Photonics K.K.
InventorsNaoki Iwata, Fusanori Kondo, Tomokazu Matsumura, Teruo Takeshita
Estimating the term…
An optical measurement device includes an irradiation optical system, a detection optical system, and a cancel circuit. In a fluorescence detection process, a sample is designated as an irradiation target, the sample is irradiated with irradiation light, measurement target light including fluorescence generated from the sample irradiated with the irradiation light and light scattered from the sample irradiated with the irradiation light is detected as detection light, a signal component corresponding to the scattered light is removed from a measurement signal corresponding to the measurement target light in consideration of a result of performing a calibration process during a preliminary process. In the preliminary process, the calibration process for removing a signal component corresponding to the scattered light from the measurement signal is performed on the basis of a calibration signal having a higher signal intensity than a signal corresponding to the scattered light in the measurement signal.
An optical measurement device for measuring optical characteristics of a measurement target object, the optical measurement device comprising:
An optical measurement method of measuring optical characteristics of a measurement target object, the optical measurement method comprising steps of:
Dependencies are inferred from the claim text.