Optical measurement device and optical measurement method

An optical measurement device for measuring optical characteristics of a measurement target object, the optical measurement device comprising:

• an irradiation optical system configured to irradiate an irradiation target with irradiation light;
• a photodetection unit configured to detect detection light caused by the irradiation light;
• and
• a signal processing unit configured to process a detection signal corresponding to the detection light,
• wherein, in a first process,
• the irradiation optical system designates a reference member for a calibration process different from the measurement target object as the irradiation target and irradiates the reference member with the irradiation light,
• the photodetection unit detects light for the calibration process as the detection light, the light for the calibration process including scattered light associated with the irradiation light from the reference member irradiated with the irradiation light, and
• the signal processing unit designates a calibration signal corresponding to the light for the calibration process as the detection signal and performs the calibration process for removing a signal component corresponding to the scattered light from the detection signal in a second process on the basis of the calibration signal, and
• wherein, in the second process,
• the irradiation optical system designates the measurement target object as the irradiation target and irradiates the measurement target object with the irradiation light,
• the photodetection unit detects measurement target light as the detection light, the measurement target light including fluorescence generated from the measurement target object irradiated with the irradiation light and light scattered from the measurement target object irradiated with the irradiation light, and
• the signal processing unit designates a measurement signal corresponding to the measurement target light as the detection signal and removes a signal component corresponding to the scattered light in the calibration process during the first process from the measurement signal.