G01N 2021/4173
Phase distribution
Official title: {Phase distribution}
G01N2021/4173 (Phase distribution) appears on 39 US grants and 54 published applications in this corpus.
Search patents in G01N- Granted patents
- 39
- Published applications
- 54
- Assignees
- 43
- Inventors
- 112
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 6 |
| 2012 | 0 | 1 |
| 2013 | 2 | 1 |
| 2014 | 0 | 3 |
| 2015 | 2 | 0 |
| 2016 | 2 | 1 |
| 2017 | 2 | 0 |
| 2018 | 0 | 3 |
| 2019 | 2 | 4 |
| 2020 | 4 | 6 |
| 2021 | 1 | 3 |
| 2022 | 5 | 2 |
| 2023 | 4 | 8 |
| 2024 | 4 | 6 |
| 2025 | 3 | 3 |
| 2026 | 2 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method and apparatus for analyte measurement including material status analysis25 Aug 2026US 12,714,337 B2DiaMonTech AG
- Observation device and observation method24 Feb 2026US 12,560,538 B2Hamamatsu Photonics K.K.
- Microscope, observation method, and program7 Oct 2025US 12,436,374 B2Nikon Corporation
- Tomographic refractive index profile evaluation of non-symmetrical glass fiber preforms and fibers themselves23 Sep 2025US 12,422,359 B2Heraeus Quartz North America LLC
- Interferometric gas sensor28 Jan 2025US 12,209,958 B2Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Method, device, and program for identifying or evaluating bile canaliculus regions20 Aug 2026US 2026/0243676 A1Hamamatsu Photonics K.K.
- Observation device and observation method13 Aug 2026US 2026/0235510 A1Hamamatsu Photonics K.K.
- Method, device, and information processing program for determining necrosis cell region22 Jan 2026US 2026/0023016 A1Hamamatsu Photonics K.K.
- Measuring apparatus, measuring method, and measuring program1 Jan 2026US 2026/0002871 A1Kioxia Corporation
- Microscope, observation method, and program25 Dec 2025US 2025/0389941 A1Nikon Corporation
Most cited
By later US patents
- Method and apparatus for imaging a physical parameter in turbid media using diffuse waves52US 5,203,339 AThe Government of the United States of America as represented by the Secretary of the Department of Health and Human Services · 1993
- Large field of view grating interferometers for X-ray phase contrast imaging and CT at high energy45US 9,329,141 B2The Johns Hopkins University · 2016
- System and method for phase-contrast X-ray imaging39US 9,439,613 B2The Johns Hopkins University · 2016
- Apparatus and method for irradiating a medium28US 8,954,130 B2Canon Kabushiki Kaisha · 2015
- Multidimensional imaging using a single point detector for a phase encoded modulated optical carrier23US 5,309,912 AThe United States of America, as represented by the Secretary, Department of Health and Human Services · 1994