Microscope, observation method, and program

An observation method of irradiating a specimen with illumination light from a light source, detecting a signal light emitted from the specimen, and observing the specimen, the method comprising:

• measuring a first phase distribution, which corresponds to specimen-induced aberration, at each of a plurality of sampling points of the specimen;
• creating, based on the first phase distributions measured at the plurality of sampling points, a phase data model showing an amount of phase change which the illumination light or the signal light receives when the illumination light or the signal light passes through a predetermined position in the specimen;
• calculating, based on the phase data model, a second phase distribution which is added to at least one of the illumination light and the signal light in order to detect at least one detection point of the specimen in a state in which specimen-induced aberration is reduced;
• and
• detecting the detection point by adding the second phase distribution to at least one of the illumination light and the signal light, wherein:
• the method further comprises sequentially providing a plurality of phase modulation patterns;
• the illumination light is irradiated at least to the sampling point, which is a measurement target of the first phase distribution, every time the phase modulation pattern is provided;
• and
• the first phase distribution at each of the plurality of the sampling points is calculated based on the received signal light.

A non-transitory computer-readable medium storing a program that controls at least a part of a microscope system configured to observe a specimen, the program causing a processing device including a computer to execute:

• reading position information of a plurality of sampling points of the specimen and information related to a first phase distribution corresponding to aberration signal light occurring in illumination light or signal light emitted from the specimen at each of the sampling points;
• causing the processing device to create, based on the position information of the plurality of sampling points and the information related to the first phase distribution of the plurality of sampling points, a phase data model showing a phase change amount which the illumination light or the signal light receives when the illumination light or the signal light passes through a predetermined position in the specimen;
• and
• calculating, based on the phase data model, a second phase distribution which is added to at least one of the illumination light and the signal light in order to detect at least one detection point of the specimen in a state in which specimen-induced aberration is reduced, wherein:
• the program further causes the processing device to sequentially provide a plurality of phase modulation patterns;
• the illumination light is irradiated at least to the sampling point, which is a measurement target of the first phase distribution, every time the phase modulation pattern is provided;
• and
• the first phase distribution at each of the plurality of the sampling points is calculated based on the received signal light.