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US 9,439,613 B2Granted
System and method for phase-contrast X-ray imaging
AssigneeThe Johns Hopkins University
InventorsDan Stutman, Michael Finkenthal
Life of this patent
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Abstract
A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.
Claims16
A differential phase contrast X-ray imaging system comprising:
- an X-ray illumination system;
- a beam splitter grating arranged in a radiation path of the X-ray illumination system and operable to receive an incident X-ray beam and provide an interference pattern of X-rays;
- a detector system arranged in a radiation path to detect X-rays after passing through the beam splitter grating and in a Talbot-Lau interferometer configuration with the beam splitter grating, wherein the detector system comprises a X-ray detector and an analyzer grating, wherein the analyzer grating comprises a plurality of sub-gratings arranged on a common substrate, the plurality of gratings including an edge sub-grating and a central sub-grating, wherein the edge sub-grating is tilted at an angle to the central sub-grating, wherein the analyzer grating is operable to intercept and block at least a portion of the interference pattern of X-rays before reaching the X-ray detector;
- a rotation stage operable to rotate the X-ray illumination system, the beam splitter grating, and the detection system about an object;
- wherein the beam splitter grating and the analyzer grating are arranged at a shallow angle relative to a plane characterized by a direction of the incident X-ray beam, wherein the shallow angle is less than 30° and wherein the detector is operable to capture a single image for each angle at which the rotation stage is rotated.
2 more elements
A differential phase contrast X-ray imaging method comprising:
- providing an incident X-ray beam using an X-ray illumination system;
- receiving the incident X-Ray beam at a beam splitter grating that is arranged in a radiation path of the X-ray illumination system and providing an interference pattern of X-rays;
- rotating a rotation stage that supports the X-ray illumination system, the beam splitter grating, and the detection system about an object;
- detecting, using a detecting system arranged in a radiation path, X-rays after passing through the beam splitter grating that is in a Talbot-Lau interferometer configuration with the beam splitter grating, wherein the detector system comprises a X-ray detector and an analyzer grating, wherein the analyzer grating comprises a plurality of sub-gratings arranged on a common substrate, the plurality of gratings including an edge sub-grating and a central sub-grating, wherein the edge sub-grating is tilted at an angle to the central sub-grating, wherein the analyzer grating is operable to intercept and block at least a portion of the interference pattern of X-rays before reaching the X-ray detector;
- and
- capturing a single image for each angle at which the rotation stage is rotated,
- wherein the beam splitter grating and the analyzer grating are arranged at a shallow angle relative to a plane characterized by a direction of the incident X-ray beam, wherein the shallow angle is less than 30.
4 more elements
Dependencies are inferred from the claim text.