G01N 2021/215
Brewster incidence arrangement
Official title: {Brewster incidence arrangement}
G01N2021/215 (Brewster incidence arrangement) appears on 26 US grants and 28 published applications in this corpus.
Search patents in G01N- Granted patents
- 26
- Published applications
- 28
- Assignees
- 24
- Inventors
- 53
- Latest grant
- 8 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 2 |
| 2006 | 2 | 1 |
| 2007 | 3 | 2 |
| 2008 | 2 | 2 |
| 2009 | 0 | 2 |
| 2010 | 0 | 1 |
| 2011 | 2 | 0 |
| 2012 | 2 | 2 |
| 2013 | 1 | 2 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 2 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 0 | 2 |
| 2020 | 1 | 0 |
| 2021 | 0 | 3 |
| 2022 | 3 | 1 |
| 2023 | 1 | 2 |
| 2024 | 3 | 1 |
| 2025 | 2 | 0 |
| 2026 | 0 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Mueller matrix ellipsometer8 Jul 2025US 12,352,687 B2Government of the United States of America, AS Represented By the Secretary of Commerce
- Ellipsometer and apparatus for inspecting semiconductor device including the ellipsometer1 Jul 2025US 12,345,626 B2Samsung Electronics Co., Ltd.
- Concentration measuring method of optically active substance and concentration measuring device of optically active substance3 Dec 2024US 12,158,412 B2FUJIFILM Corporation
- Angle independent optical surface inspector29 Oct 2024US 12,130,243 B2Lumina Instruments Inc.
- Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone error30 Jan 2024US 11,885,738 B1J. A. Woollam Co. Inc.
- Multi-Function Optical Analyzer27 Aug 2026US 2026/0251553 A1Board of Trustees of Michigan State University
- Mueller matrix ellipsometer11 Jan 2024US 2024/0011894 A1Government of the United States of America, AS Represented By the Secretary of Commerce
- Concentration measuring method of optically active substance and concentration measuring device of optically active substance6 Jul 2023US 2023/0213436 A1FUJIFILM Corporation
- Ellipsometer and apparatus for inspecting semiconductor device including the ellipsometer18 May 2023US 2023/0152213 A1Samsung Electronics Co., Ltd.
- Angle independent optical surface inspector16 Jun 2022US 2022/0187218 A1Lumina Instruments Inc.
Most cited
By later US patents
- Analytical method and apparatus84US 6,493,097 B1Biacore AB · 2002
- Analytical method and apparatus59US 6,714,303 B2Biacore AB · 2004
- Analytical method and apparatus21US 6,999,175 B2Biacore AB · 2006
- Analytical method and apparatus15US 7,262,866 B2Biacore AB · 2007
- Analytical method and apparatus12US 7,081,958 B2Biacore AB · 2006