Angle independent optical surface inspector
AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Life of this patent
Estimating the term…
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AssigneeLumina Instruments Inc.
InventorsSteven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
Estimating the term…
An angle independent optical surface inspector capable of generating a light beam, directing the light beam to a sample, and de-scanning a reflected light beam that is reflected from the sample, thereby generating a first de-scanned light beam. The de-scanning is performed at approximately one focal length of a de-scanning lens from an irradiation location where the light beam irradiates the sample. The optical inspector also capable of focusing the first de-scanned light beam, thereby generating a focused light beam, and measuring the location of the focused light beam. The measuring of the location is performed at approximately one focal length of a focusing lens from the focusing lens. The incident angle of the light beam is within ten degrees of Brewster's angle. The focusing is performed by an achromatic lens.
A method, comprising:
Dependencies are inferred from the claim text.