G01N 2021/1719
Carrier modulation in semiconductors
Official title: {Carrier modulation in semiconductors}
G01N2021/1719 (Carrier modulation in semiconductors) appears on 30 US grants and 27 published applications in this corpus.
Search patents in G01N- Granted patents
- 30
- Published applications
- 27
- Assignees
- 27
- Inventors
- 70
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 2 |
| 2007 | 2 | 2 |
| 2008 | 1 | 3 |
| 2009 | 2 | 1 |
| 2010 | 3 | 3 |
| 2011 | 2 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 3 |
| 2014 | 3 | 1 |
| 2015 | 2 | 3 |
| 2016 | 0 | 1 |
| 2017 | 1 | 0 |
| 2018 | 2 | 0 |
| 2019 | 1 | 0 |
| 2020 | 0 | 3 |
| 2021 | 0 | 0 |
| 2022 | 2 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Field-biased nonlinear optical metrology using corona discharge source14 Apr 2026US 12,601,778 B2FemtoMetrix, Inc.
- Method for testing lifetime of surface state carrier of semiconductor8 Aug 2023US 11,719,739 B2Tongji University
- Carrier lifespan measurement method and carrier lifespan measurement device16 Aug 2022US 11,415,525 B2Hamamatsu Photonics K.K.
- Concentration measurement method and concentration measurement device22 Mar 2022US 11,280,776 B2Hamamatsu Photonics K.K.
- Photoelectric conversion element evaluation apparatus21 May 2019US 10,298,174 B2Yokogawa Electric Corporation
- Method for monitoring influence of defects in few-layer two-dimensional material on exciton transport2 Jan 2025US 2025/0003893 A1
- Method for testing lifetime of surface state carrier of semiconductor10 Feb 2022US 2022/0043049 A1Tongji University
- Carrier lifespan measurement method and carrier lifespan measurement device31 Dec 2020US 2020/0408701 A1Hamamatsu Photonics K.K.
- Concentration measurement method and concentration measurement device31 Dec 2020US 2020/0408730 A1Hamamatsu Photonics K.K.
- Field-biased nonlinear optical metrology using corona discharge source20 Feb 2020US 2020/0057104 A1FemtoMetrix, Inc.
Most cited
By later US patents
- Method and apparatus for optically determining defects in a semiconductor material64US 4,652,757 AAT&T Technologies, Inc. · 1987
- Modulated scatterometry26US 6,888,632 B2Therma-Wave, Inc. · 2005
- Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control25US 5,270,797 ABrooklyn College Foundation · 1993
- Method and apparatus for determining a material's characteristics by photoreflectance21US 5,260,772 A1993
- Method for in-situ determination of the fermi level in GaAs and similar materials by photoreflectance8US 5,159,410 A1992