Photoelectric conversion element evaluation apparatus
AssigneeYokogawa Electric Corporation
InventorsAkishige Ito, Masato Ishikawa, Takashi Tsubota, Yoshinori Matsumoto
Life of this patent
Estimating the term…
Abstract
A photoelectric conversion element evaluation apparatus includes: a probe light source that irradiates a photoelectric conversion element as the object of measurement with probe light; a pump light source that irradiates the photoelectric conversion element being irradiated with the probe light with pulsed pump light; and a light receiving element that detects time dependency of a change in an amount of the probe light obtained from the photoelectric conversion element.
Claims16
A photoelectric conversion element evaluation apparatus comprising:
- a probe light source that irradiates a photoelectric conversion element as the object of measurement with probe light;
- a pump light source that irradiates the photoelectric conversion element being irradiated with the probe light with pulsed pump light;
- a light receiving element that detects time dependency of a change in an amount of the probe light reflected from the photoelectric conversion element;
- and
- a data processing circuit that evaluates a characteristic of the photoelectric conversion element based on the time dependency of the change in the amount of light and a film thickness of the photoelectric conversion element.
An apparatus comprising:
- a probe source that irradiates a thin film solar cell with probe light;
- a pump source that irradiates the thin film solar cell being irradiated with the probe light, with pulsed pump light;
- a photodetector that detects a time dependency of a change in an amount of the probe light reflected from the thin film solar cell;
- and
- a circuit that determines whether the thin film solar cell is defective based on the amount of the probe light that is detected and a film thickness of the thin film solar cell.
An apparatus comprising:
- a probe source that individually irradiates each of a plurality of thin film solar cells printed on a rolled substrate with probe light;
- a pump source that irradiates an irradiated solar cell of the plurality of thin film solar cells that is being irradiated with the probe light, with pulsed pump light;
- a photodetector that detects a time dependency of a change in an amount of the probe light reflected from the irradiated solar cell;
- and
- a circuit that determines whether the irradiated solar cell of the plurality of thin film solar cells is defective based on the amount of the probe light that is detected and a film thickness of thin film solar cells.
Dependencies are inferred from the claim text.