Carrier lifespan measurement method and carrier lifespan measurement device
AssigneeHamamatsu Photonics K.K.
InventorTomonori Nakamura
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AssigneeHamamatsu Photonics K.K.
InventorTomonori Nakamura
Estimating the term…
A carrier lifetime measurement method for measuring a lifetime of carriers in a measurement target object includes an irradiation step of irradiating a DUT 10 serving as a measurement target object with measurement light and stimulus light subjected to intensity modulation using a plurality of frequencies, an outputting step of outputting a detection signal by detecting an intensity of reflected light from the DUT 10 or transmitted light through the DUT 10, and a generation step of detecting a phase delay of the detection signal with respect to a modulation signal including a frequency in association with a concentration of impurities in a measurement target region of the plurality of frequencies and generating image data indicating a distribution of lifetimes of carriers in the DUT 10 on the basis of the phase delay.
A carrier lifetime measurement method for measuring a lifetime of carriers in a measurement target object, the carrier lifetime measurement method comprising:
A carrier lifetime measurement device for measuring a lifetime of carriers in a measurement target object, the carrier lifetime measurement device comprising:
Dependencies are inferred from the claim text.