G01J 5/802
By correcting for emissivity
Official title: {by correcting for emissivity}
G01J5/802 (By correcting for emissivity) appears on 96 US grants and 90 published applications in this corpus.
Search patents in G01J- Granted patents
- 96
- Published applications
- 90
- Assignees
- 94
- Inventors
- 263
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 2 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 2 |
| 2009 | 0 | 0 |
| 2010 | 1 | 2 |
| 2011 | 4 | 2 |
| 2012 | 0 | 1 |
| 2013 | 1 | 1 |
| 2014 | 0 | 1 |
| 2015 | 2 | 4 |
| 2016 | 2 | 3 |
| 2017 | 3 | 3 |
| 2018 | 2 | 3 |
| 2019 | 4 | 8 |
| 2020 | 10 | 10 |
| 2021 | 6 | 7 |
| 2022 | 3 | 13 |
| 2023 | 8 | 10 |
| 2024 | 11 | 9 |
| 2025 | 8 | 5 |
| 2026 | 6 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for estimating the temperature and the oxide thickness of a steel strip6 Oct 2026US 12,754,073 B2ArcelorMittal
- Estimation of the temperature of a steel product14 Jul 2026US 12,680,878 B2ArcelorMittal
- Methods and systems for measurement of nonthermal far infrared radiation28 Apr 2026US 12,613,140 B2
- Light irradiation type heat treatment method and heat treatment apparatus10 Mar 2026US 12,571,593 B2SCREEN Holdings Co., Ltd.
- Temperature measurement method and heat treatment apparatus10 Feb 2026US 12,550,665 B2SCREEN Holdings Co., Ltd.
- A method and an apparatus for contactlessly determining the temperature of a stream of conveyed material and granulation device having such a contactless temperature determination apparatus28 May 2026US 2026/0146893 A1Maag Germany GmbH
- Light irradiation type heat treatment method and heat treatment apparatus21 May 2026US 2026/0139903 A1SCREEN Holdings Co., Ltd.
- Method and an Apparatus of Calibrating a Thermal Satellite for Measuring Land Surface Temperature2 Apr 2026US 2026/0092816 A1OroraTech GmbH
- Reference wafer for high fidelity in-situ temperature metrology calibration22 Jan 2026US 2026/0022972 A1Lam Research Corporation
- Workpiece Processing Apparatus with Thermal Processing Systems11 Dec 2025US 2025/0379073 A1Beijing E-Town Semiconductor Technology Co., Ltd.
Most cited
By later US patents
- Multi-point pyrometry with real-time surface emissivity compensation110US 5,156,461 ATexas Instruments Incorporated · 1992
- Fiber optic network for multi-point emissivity-compensated semiconductor wafer pyrometry79US 5,317,656 ATexas Instruments Incorporated · 1994
- Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing69US 4,984,902 APeak Systems, Inc. · 1991
- Multi-point pyrometry with real-time surface emissivity compensation67US 5,255,286 ATexas Instruments Incorporated · 1993
- Method for measuring temperature of semiconductor substrate and apparatus therefor52US 4,890,245 ANikon Corporation · 1989