G01B 9/02095
Detecting deformation from original shape
Official title: {detecting deformation from original shape}
G01B9/02095 (Detecting deformation from original shape) appears on 44 US grants and 37 published applications in this corpus.
Search patents in G01B- Granted patents
- 44
- Published applications
- 37
- Assignees
- 35
- Inventors
- 96
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 4 |
| 2005 | 1 | 0 |
| 2006 | 1 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 1 |
| 2012 | 1 | 0 |
| 2013 | 0 | 3 |
| 2014 | 2 | 1 |
| 2015 | 1 | 1 |
| 2016 | 1 | 1 |
| 2017 | 0 | 1 |
| 2018 | 1 | 3 |
| 2019 | 6 | 1 |
| 2020 | 2 | 4 |
| 2021 | 1 | 3 |
| 2022 | 3 | 3 |
| 2023 | 2 | 4 |
| 2024 | 2 | 6 |
| 2025 | 2 | 0 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Cylindric decomposition for efficient mitigation of substrate deformation with film deposition and ion implantation29 Sep 2026US 12,751,253 B2APPLIED Materials.Inc.
- Defect detection device and defect detection method23 Jun 2026US 12,663,258 B2Shimadzu Corporation
- Compact shearography system with adjustable shear distance3 Mar 2026US 12,566,058 B2Nikon Corporation
- Defect inspection apparatus1 Jul 2025US 12,345,653 B2Shimadzu Corporation
- Defect inspection device and defect inspection method7 Jan 2025US 12,188,769 B2Shimadzu Corporation
- Determination of a change of object's shape5 Dec 2024US 2024/0401928 A1Nikon Corporation
- Mitigation of saddle deformation of substrates using film deposition and edge ion implantation8 Aug 2024US 2024/0266174 A1APPLIED Materials.Inc.
- Stress management for precise substrate -to- substrate bonding8 Aug 2024US 2024/0266186 A1APPLIED Materials.Inc.
- Optimized film deposition and ion implantation for mitigation of stress and deformation in substrates8 Aug 2024US 2024/0266230 A1APPLIED Materials.Inc.
- Cylindric decomposition for efficient mitigation of substrate deformation with film deposition and ion implantation8 Aug 2024US 2024/0266231 A1APPLIED Materials.Inc.
Most cited
By later US patents
- Method and apparatus for speckle-shearing interferometric deformation analysis130US 4,682,892 AThe Goodyear Tire & Rubber Company · 1987
- Apparatus for electronic speckle pattern interferometry26US 6,188,482 B1Board of Trustees operating Michigan State University · 2001
- Method for measuring residual stresses in materials by plastically deforming the material and interference pattern comparison16US 5,432,595 A1995
- Compact fiber-optic electronic laser speckle pattern shearography16US 6,040,900 ACybernet Systems Corporation · 2000
- Dual-lens shearing interferometer10US 5,004,345 A1991