G01B 9/02024
Measuring in transmission, i.e. light traverses the object
Official title: {Measuring in transmission, i.e. light traverses the object}
G01B9/02024 (Measuring in transmission, i.e. light traverses the object) appears on 93 US grants and 82 published applications in this corpus.
Search patents in G01B- Granted patents
- 93
- Published applications
- 82
- Assignees
- 82
- Inventors
- 254
- Latest grant
- 21 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 4 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 1 | 0 |
| 2000 | 6 | 0 |
| 2001 | 3 | 2 |
| 2002 | 1 | 0 |
| 2003 | 4 | 4 |
| 2004 | 5 | 3 |
| 2005 | 3 | 6 |
| 2006 | 3 | 2 |
| 2007 | 2 | 2 |
| 2008 | 0 | 3 |
| 2009 | 1 | 2 |
| 2010 | 3 | 4 |
| 2011 | 3 | 5 |
| 2012 | 2 | 1 |
| 2013 | 7 | 5 |
| 2014 | 1 | 0 |
| 2015 | 2 | 1 |
| 2016 | 1 | 2 |
| 2017 | 2 | 2 |
| 2018 | 3 | 6 |
| 2019 | 4 | 4 |
| 2020 | 4 | 8 |
| 2021 | 6 | 5 |
| 2022 | 6 | 3 |
| 2023 | 1 | 7 |
| 2024 | 3 | 2 |
| 2025 | 3 | 2 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Bonding energy measurement21 Jul 2026US 12,687,485 B2Tokyo Electron Limited
- Geometric phase in-line scanning holography system for transmissive object19 May 2026US 12,632,006 B2Cubixel Co., Ltd.
- In-situ residual intensity noise measurement method and system8 Jul 2025US 12,352,571 B2Emcore Corporation
- Heterodyne grating interferometry system based on secondary diffraction17 Jun 2025US 12,332,053 B2Beijing U-Precision Tech Co., Ltd.
- Three-dimensional measurement device25 Mar 2025US 12,259,230 B2Ckd Corporation
- Phase amplification microscopy19 Feb 2026US 2026/0049930 A1The Chinese University of Hong Kong
- Bonding energy measurement2 Oct 2025US 2025/0305935 A1Tokyo Electron Limited
- Methods and systems for three-dimensional imaging of a transparent biological object in a biological sample by full-field optical tomography6 Feb 2025US 2025/0044075 A1Centre National De La Recherche Scientifique
- Full-field metrology tool for waveguide combiners and meta-surfaces19 Sep 2024US 2024/0310639 A1APPLIED Materials.Inc.
- Interferometric speckle visibility spectroscopy12 Sep 2024US 2024/0302158 A1California Institute of Technology
Most cited
By later US patents
- System and method for optically measuring a structure261US 5,880,838 ACalifornia Institute of California · 1999
- Optical quadrature Interferometer189US 6,020,963 ANortheastern University · 2000
- Infrared scanning interferometry apparatus and method90US 6,195,168 B1Zygo Corporation · 2001
- Optical systems for measuring form and geometric dimensions of precision engineered parts75US 6,822,745 B2Zygo Corporation · 2004
- Interferometer device and method62US 7,924,973 B2CSEM Centre Suisse d'Electronique et de Microtechnique SA · 2011