G01B 7/085
For measuring thickness of coating
Official title: {for measuring thickness of coating}
G01B7/085 (For measuring thickness of coating) appears on 64 US grants and 49 published applications in this corpus.
Search patents in G01B- Granted patents
- 64
- Published applications
- 49
- Assignees
- 64
- Inventors
- 186
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 3 |
| 2003 | 3 | 2 |
| 2004 | 3 | 1 |
| 2005 | 0 | 1 |
| 2006 | 2 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 2 | 2 |
| 2015 | 0 | 2 |
| 2016 | 1 | 2 |
| 2017 | 2 | 3 |
| 2018 | 4 | 1 |
| 2019 | 1 | 4 |
| 2020 | 3 | 3 |
| 2021 | 4 | 3 |
| 2022 | 0 | 2 |
| 2023 | 4 | 4 |
| 2024 | 4 | 5 |
| 2025 | 2 | 3 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Capacitative sensing device for in-situ monitoring of coatings22 Sep 2026US 12,742,627 B2Halliburton Energy Services.Inc.
- Method for obtaining the equivalent oxide thickness of a dielectric layer26 May 2026US 12,638,472 B2Msscorps Co., Ltd.
- Method and system for monitoring the film thickness of a lubricant within a lubricated bearing17 Feb 2026US 12,553,700 B2Aktiebolaget Skf
- Electrical test of optical components via metal-insulator-semiconductor capacitor structures15 Apr 2025US 12,276,565 B2Cisco Technology, Inc.
- Determining plastic or cellulose levels in composites7 Jan 2025US 12,188,767 B2Continuus Materials Intellectual Property, LLC
- Substrate processing apparatus, pipe with measuring device, and measuring method17 Sep 2026US 2026/0273591 A1Kioxia Corporation
- Measurement method, observation device, and program3 Sep 2026US 2026/0259032 A1Nsk Ltd.
- Improved measurement probe for testing coating thickness on flat sheets6 Aug 2026US 2026/0227170 A1Innosen Limited
- Sensor and method for measuring a physical variable of a planar medium30 Jul 2026US 2026/0219021 A1Micro-Epsilon Messtechnik GmbH & Co.KG
- System, apparatus, and device for measuring an amount of deposited dielectric material26 Mar 2026US 2026/0085921 A1ASM IP Holding B. V.
Most cited
By later US patents
- In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection220US 5,081,421 AAT&T Bell Laboratories · 1992
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current104US 6,597,193 B2Semiconductor Diagnostics, Inc. · 2003
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current97US 6,680,621 B2Semiconductor Diagnostics, Inc. · 2004
- Chemical-mechanical polishing tool with end point measurement station70US 5,492,594 AInternational Business Machines Corporation · 1996
- Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing62US 6,020,264 AInternational Business Machines Corporation · 2000