G01B 7/08
Using capacitive means
Official title: {using capacitive means}
G01B7/08 (Using capacitive means) appears on 223 US grants and 161 published applications in this corpus.
Search patents in G01B- Granted patents
- 223
- Published applications
- 161
- Assignees
- 172
- Inventors
- 521
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 3 | 0 |
| 1984 | 2 | 0 |
| 1985 | 4 | 0 |
| 1986 | 1 | 0 |
| 1987 | 3 | 0 |
| 1988 | 4 | 0 |
| 1989 | 5 | 0 |
| 1990 | 7 | 0 |
| 1991 | 3 | 0 |
| 1992 | 14 | 0 |
| 1993 | 8 | 0 |
| 1994 | 4 | 0 |
| 1995 | 3 | 0 |
| 1996 | 8 | 0 |
| 1997 | 4 | 0 |
| 1998 | 4 | 0 |
| 1999 | 3 | 0 |
| 2000 | 4 | 0 |
| 2001 | 2 | 0 |
| 2002 | 3 | 4 |
| 2003 | 6 | 6 |
| 2004 | 4 | 2 |
| 2005 | 1 | 4 |
| 2006 | 3 | 3 |
| 2007 | 1 | 0 |
| 2008 | 3 | 3 |
| 2009 | 2 | 6 |
| 2010 | 2 | 4 |
| 2011 | 2 | 5 |
| 2012 | 4 | 2 |
| 2013 | 1 | 8 |
| 2014 | 5 | 11 |
| 2015 | 6 | 6 |
| 2016 | 9 | 4 |
| 2017 | 9 | 11 |
| 2018 | 8 | 4 |
| 2019 | 8 | 7 |
| 2020 | 8 | 10 |
| 2021 | 10 | 14 |
| 2022 | 3 | 8 |
| 2023 | 8 | 7 |
| 2024 | 7 | 9 |
| 2025 | 8 | 14 |
| 2026 | 6 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Capacitative sensing device for in-situ monitoring of coatings22 Sep 2026US 12,742,627 B2Halliburton Energy Services.Inc.
- Sensor arrangement for a combine harvester15 Sep 2026US 12,733,579 B2Deere & Company
- Multi-mode thickness measurement device and methods8 Sep 2026US 12,729,946 B2AGR International, Inc.
- Method for obtaining the equivalent oxide thickness of a dielectric layer26 May 2026US 12,638,472 B2Msscorps Co., Ltd.
- Wire harness5 May 2026US 12,617,356 B2Yazaki Corporation
- Substrate processing apparatus, pipe with measuring device, and measuring method17 Sep 2026US 2026/0273591 A1Kioxia Corporation
- Measurement method, observation device, and program3 Sep 2026US 2026/0259032 A1Nsk Ltd.
- Improved measurement probe for testing coating thickness on flat sheets6 Aug 2026US 2026/0227170 A1Innosen Limited
- Sensor and method for measuring a physical variable of a planar medium30 Jul 2026US 2026/0219021 A1Micro-Epsilon Messtechnik GmbH & Co.KG
- Methods And Systems For Mapping Surface Topography Of Semiconductor Substrates2 Jul 2026US 2026/0185825 A1
Most cited
By later US patents
- In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection220US 5,081,421 AAT&T Bell Laboratories · 1992
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current104US 6,597,193 B2Semiconductor Diagnostics, Inc. · 2003
- Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current97US 6,680,621 B2Semiconductor Diagnostics, Inc. · 2004
- Chemical-mechanical polishing tool with end point measurement station70US 5,492,594 AInternational Business Machines Corporation · 1996
- Device and method for capacitive measurement by a floating bridge69US 8,149,002 B2Nanotec Solution · 2012