G01B 11/303
Using photoelectric detection means
Official title: {using photoelectric detection means}
G01B11/303 (Using photoelectric detection means) appears on 761 US grants and 656 published applications in this corpus.
Search patents in G01B- Granted patents
- 761
- Published applications
- 656
- Assignees
- 482
- Inventors
- 1,762
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 2 | 0 |
| 1978 | 5 | 0 |
| 1979 | 4 | 0 |
| 1980 | 3 | 0 |
| 1981 | 3 | 0 |
| 1982 | 7 | 0 |
| 1983 | 3 | 0 |
| 1984 | 2 | 0 |
| 1985 | 4 | 0 |
| 1986 | 2 | 0 |
| 1987 | 11 | 0 |
| 1988 | 16 | 0 |
| 1989 | 14 | 0 |
| 1990 | 14 | 0 |
| 1991 | 9 | 0 |
| 1992 | 15 | 0 |
| 1993 | 10 | 0 |
| 1994 | 14 | 0 |
| 1995 | 9 | 0 |
| 1996 | 10 | 0 |
| 1997 | 11 | 0 |
| 1998 | 10 | 0 |
| 1999 | 7 | 0 |
| 2000 | 15 | 0 |
| 2001 | 19 | 5 |
| 2002 | 14 | 9 |
| 2003 | 15 | 8 |
| 2004 | 11 | 20 |
| 2005 | 7 | 14 |
| 2006 | 15 | 15 |
| 2007 | 18 | 19 |
| 2008 | 11 | 10 |
| 2009 | 10 | 17 |
| 2010 | 13 | 16 |
| 2011 | 11 | 8 |
| 2012 | 12 | 11 |
| 2013 | 18 | 21 |
| 2014 | 11 | 19 |
| 2015 | 15 | 43 |
| 2016 | 20 | 27 |
| 2017 | 26 | 33 |
| 2018 | 27 | 48 |
| 2019 | 43 | 36 |
| 2020 | 43 | 47 |
| 2021 | 38 | 46 |
| 2022 | 40 | 44 |
| 2023 | 38 | 31 |
| 2024 | 33 | 36 |
| 2025 | 30 | 40 |
| 2026 | 19 | 33 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and apparatus for checking a connection during a laser-based connecting method11 Aug 2026US 12,703,042 B2Ford Global Technologies, LLC
- Methods and systems to measure properties of moving products in device manufacturing machines4 Aug 2026US 12,699,049 B2APPLIED Materials.Inc.
- Method and a system for assessing and optionally monitoring or controlling the texture of a surface7 Jul 2026US 12,675,894 B2BASF Coatings GmbH
- Sheet identification device, image processing apparatus, and sheet identification method16 Jun 2026US 12,656,107 B2KYOCERA Document Solutions Inc.
- Apparatus and method for quantifying the surface flatness of three-dimensional point cloud data12 May 2026US 12,624,942 B2AIPhotonics Limited
- Device for measuring the flatness of a surface or the thickness of a flat glass panel8 Oct 2026US 2026/0309481 A1
- Methods and apparatuses for obtaining a calibration for a substrate topography measurement and methods and apparatuses for determining a topography of a substrate using the calibration8 Oct 2026US 2026/0310100 A1ASML Netherlands B. V.
- Spectral reflectometry sensor for a feedback loop in the polishing of material samples1 Oct 2026US 2026/0298627 A1Georgia Tech Research Corporation
- Measuring of surface deformations on glass surfaces1 Oct 2026US 2026/0298838 A1Viprotron GmbH
- Top plate for cooking device, production method therefor, and method for assessing charring24 Sep 2026US 2026/0285745 A1Nippon Electric Glass Co., Ltd.
Most cited
By later US patents
- Method for broad wavelength scatterometry233US 5,867,276 ABio-Rad Laboratories, Inc. · 1999
- Method for the scanning confocal light-optical microscopic and indepth examination of an extended field and devices for implementing said method226US 4,965,441 ACommissariat A L' Energie Atomique · 1990
- Performing selected optical measurements with optical coherence domain reflectometry168US 6,437,867 B2Research Foundation of the City University of New York · 2002
- Sub-nyquist interferometry130US 4,791,584 AEastman Kodak Company · 1988
- Apparatus for semiconductor device fabrication diagnosis and prognosis127US 5,719,495 ATexas Instruments Incorporated · 1998