Method and a system for assessing and optionally monitoring or controlling the texture of a surface

A system for assessing and optionally monitoring a texture of a surface, comprising:

• (a) an input channel connected to a processing device, said input channel being configured to provide an image data to the processing device,
• (b) the processing device configured to
• process image data of a surface comprising a line pattern, wherein the line pattern is obtained by projecting a predefined line pattern onto the surface, and
• derive at least one texture parameter of the surface from the line pattern in the processed image data by extracting a plurality of parallel lines from the processed image data using a pattern recognition algorithm, forming at least one concatenated line by concatenating at least two extracted parallel lines, and calculating a wavelength spectrum of each concatenated line by means of a fast Fourier transformation, and
• optionally, monitor the at least one derived texture parameter by providing a monitoring signal to a surface preparation device, and
• (c) an output channel configured to display the derived at least one texture parameter, and
• (d) optionally, at least one surface preparation device connected to the processing device and configured to prepare the surface.