G01B 11/0658
With measurement of emissivity or reradiation
Official title: {with measurement of emissivity or reradiation}
G01B11/0658 (With measurement of emissivity or reradiation) appears on 102 US grants and 98 published applications in this corpus.
Search patents in G01B- Granted patents
- 102
- Published applications
- 98
- Assignees
- 70
- Inventors
- 195
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 2 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 3 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 3 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 4 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 3 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 1 | 3 |
| 2006 | 3 | 0 |
| 2007 | 0 | 2 |
| 2008 | 1 | 2 |
| 2009 | 2 | 5 |
| 2010 | 3 | 9 |
| 2011 | 2 | 5 |
| 2012 | 9 | 6 |
| 2013 | 4 | 14 |
| 2014 | 6 | 4 |
| 2015 | 9 | 2 |
| 2016 | 5 | 3 |
| 2017 | 6 | 6 |
| 2018 | 1 | 2 |
| 2019 | 3 | 3 |
| 2020 | 1 | 3 |
| 2021 | 4 | 6 |
| 2022 | 2 | 3 |
| 2023 | 5 | 7 |
| 2024 | 2 | 2 |
| 2025 | 4 | 3 |
| 2026 | 2 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Cleaning plant for metal products14 Apr 2026US 12,601,065 B2Danieli & C. Officine Meccaniche SpA
- Measurement of melt pool position in additive manufacturing24 Mar 2026US 12,584,728 B2Nikon Corporation
- Virtual metrology apparatus, virtual metrology method, and virtual metrology program25 Nov 2025US 12,480,756 B2Tokyo Electron Limited
- Systems and methods for the in-line measurement of alkali metal-containing structures and alkali ion-containing structures1 Jul 2025US 12,345,640 B2Elevated Materials US LLC
- System for detecting thickness of a coating autonomously applied to a structure25 Mar 2025US 12,257,590 B2Foreman Technologies Inc.
- Apparatus and method for determining a lacquer coating thickness on electrical sheets10 Sep 2026US 2026/0266593 A1Emg Automation GmbH
- Measurement of melt pool position in additive manufacturing2 Jul 2026US 2026/0185820 A1Nikon Corporation
- Global Skin Friction and Surface Pressure Measurements Using a Global Luminescent Oil-Film (GLOF) Skin Friction Meter19 Mar 2026US 2026/0079073 A1
- Virtual metrology apparatus, virtual metrology method, and virtual metrology program26 Feb 2026US 2026/0056009 A1Tokyo Electron Limited
- System for detecting thickness of a coating autonomously applied to a structure7 Aug 2025US 2025/0249473 A1Foreman Technologies Inc., dba PaintJet
Most cited
By later US patents
- Evaluating both thickness and compositional variables in a thin film sample74US 4,679,946 ATherma-Wave, Inc. · 1987
- Techniques for measuring the thickness of a film formed on a substrate68US 5,166,080 ALuxtron Corporation · 1992
- Non-contact optical techniques for measuring surface conditions63US 5,490,728 ALuxtron Corporation · 1996
- Optical method for the characterization of laterally-patterned samples in integrated circuits49US 6,321,601 B1Brown University Research Foundation · 2001
- Three-dimensional imaging using absorption49US 8,107,086 B2Massachusetts Institute of Technology · 2012