Non-contact optical techniques for measuring surface conditions
AssigneeLuxtron Corporation
InventorsCharles W. Schietinger, Bruce E. Adams
Life of this patent
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AssigneeLuxtron Corporation
InventorsCharles W. Schietinger, Bruce E. Adams
Estimating the term…
Thermal, optical, physical and chemical characteristics of a substrate (11) surface are determined with non-contact optical techniques that include illuminating (23) the surface with radiation having a ripple intensity characteristic (51), and then measuring the combined intensities (53) of that radiation after modification by the substrate surface and radiation emitted from the surface. Precise determinations of emissivity, reflectivity, temperature, changing surface composition, the existence of any layer formed on the surface and its thickness are all possible from this measurement. They may be made in situ and substantially in real time, thus allowing the measurement to control (39, 41) various processes of treating a substrate surface. This has significant applicability to semiconductor wafer processing and metal processing.
A method of determining a characteristic of a layer of one material on a surface of another material, comprising the steps of:
A non-contact method of determining a characteristic of a surface, comprising the steps
In a system for forming a layer of material on a substrate surface that is positioned within a chamber having a substantially optically transparent window in a wall thereof, wherein said substrate is heated by directing continuous wave electromagnetic radiation of a given bandwidth against said substrate through said window from outside of said chamber from an electromagnetic radiation source that is characterized by having a time varying intensity component, an improvement adapted to monitor formation of said layer, comprising:
A method of monitoring one of a physical and chemical characteristic of a material surface, comprising the steps of:
A non-contact method of measuring the temperature of a surface, comprising:
A non-contact method of measuring the temperature of a surface, comprising:
In a process of heating an object by directing electromagnetic radiation against at least one surface of the object from a plurality of lamps energized from a power source having a periodic magnitude variation, wherein an intensity of the radiation from the lamps includes a time varying component, a method of determining a characteristic of said object surface, comprising:
Dependencies are inferred from the claim text.