B82B 3/009
Characterizing nanostructures, i.e. measuring and identifying electrical or mechanical constants
Official title: {Characterizing nanostructures, i.e. measuring and identifying electrical or mechanical constants}
B82B3/009 (Characterizing nanostructures, i.e. measuring and identifying electrical or mechanical constants) appears on 15 US grants and 16 published applications in this corpus.
Search patents in B82B- Granted patents
- 15
- Published applications
- 16
- Assignees
- 11
- Inventors
- 30
- Latest grant
- 29 Apr 2025
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| 2015 | 0 | 1 |
| 2016 | 1 | 4 |
| 2017 | 1 | 1 |
| 2018 | 3 | 2 |
| 2019 | 2 | 3 |
| 2020 | 2 | 1 |
| 2021 | 1 | 3 |
| 2022 | 1 | 0 |
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| 2025 | 1 | 0 |
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Most cited
By later US patents
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