System and method for developing production nano-material
AssigneeNasreen Chopra
InventorNasreen G. Chopra
Life of this patent
Estimating the term…
Loading patent…
AssigneeNasreen Chopra
InventorNasreen G. Chopra
Estimating the term…
A method for developing a manufacturing process includes measuring, in a first testing environment, a primary property of a nano-engineered material at one or more positions to provide one or more measurements. The method also includes determining whether the one or more measurements satisfy a first tolerance criterion and taking a further action based on whether the one or more measurements satisfy the first tolerance criterion. Additionally, a method of measuring thermal properties of a nano-engineered material includes irradiating a nano-engineered material with laser radiation, wherein the laser radiation impinges on a first surface of the nano-engineered material at one ore more locations, capturing at least one image of the nano-engineered material, and analyzing the at least one image to characterize the thermal properties of the nano-engineered material.
A method for developing a manufacturing process, comprising:
A method of measuring thermal properties of a nano-engineered material, comprising:
A method of measuring thermal properties of a nano-engineered material, comprising:
A method of measuring thermal properties of a nano-engineered material, comprising:
Dependencies are inferred from the claim text.