Y10T 29/49769
Using optical instrument [excludes mere human eyeballing]
Y10T29/49769 (Using optical instrument [excludes mere human eyeballing]) appears on 363 US grants and 253 published applications in this corpus.
Search patents in Y10T- Granted patents
- 363
- Published applications
- 253
- Assignees
- 231
- Inventors
- 706
- Latest grant
- 10 Dec 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 0 | 0 |
| 1978 | 4 | 0 |
| 1979 | 3 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 3 | 0 |
| 1983 | 3 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 4 | 0 |
| 1987 | 3 | 0 |
| 1988 | 7 | 0 |
| 1989 | 4 | 0 |
| 1990 | 4 | 0 |
| 1991 | 5 | 0 |
| 1992 | 4 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 5 | 0 |
| 1996 | 7 | 0 |
| 1997 | 12 | 0 |
| 1998 | 14 | 0 |
| 1999 | 8 | 0 |
| 2000 | 12 | 0 |
| 2001 | 19 | 9 |
| 2002 | 16 | 21 |
| 2003 | 14 | 15 |
| 2004 | 9 | 13 |
| 2005 | 12 | 15 |
| 2006 | 12 | 18 |
| 2007 | 7 | 13 |
| 2008 | 10 | 8 |
| 2009 | 9 | 6 |
| 2010 | 8 | 7 |
| 2011 | 5 | 16 |
| 2012 | 11 | 12 |
| 2013 | 9 | 27 |
| 2014 | 20 | 41 |
| 2015 | 22 | 14 |
| 2016 | 24 | 2 |
| 2017 | 18 | 3 |
| 2018 | 5 | 6 |
| 2019 | 5 | 1 |
| 2020 | 5 | 1 |
| 2021 | 1 | 2 |
| 2022 | 1 | 1 |
| 2023 | 1 | 1 |
| 2024 | 3 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- System with substrate carrier deterioration detection and repair10 Dec 2024US 12,162,134 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Visual crimp monitoring27 Feb 2024US 11,913,774 B2HARTING Electric GmbH & Co. KG
- Workpiece processing method13 Feb 2024US 11,897,705 B2Seiko Epson Corporation
- Substrate carrier deterioration detection and repair21 Feb 2023US 11,584,019 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Profile measuring apparatus, structure manufacturing system, method for measuring profile, method for manufacturing structure, and non-transitory computer readable medium22 Nov 2022US 11,506,484 B2Nikon Corporation
- Substrate carrier deterioration detection and repair27 Mar 2025US 2025/0100161 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Substrate carrier deterioration detection and repair22 Jun 2023US 2023/0191619 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Visual crimp monitoring16 Jun 2022US 2022/0187058 A1HARTING Electric GmbH & Co. KG
- Workpiece processing method28 Oct 2021US 2021/0331874 A1Seiko Epson Corporation
- Substrate Carrier Deterioration Detection and Repair22 Apr 2021US 2021/0118665 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Method and apparatus for transferring wafers between cassettes and a boat541US 4,770,590 ASilicon Valley Group, Inc. · 1988
- Method of joining components for a composite showerhead electrode assembly for a plasma processing apparatus529US 8,484,846 B2Lam Research Corporation · 2013
- Vision target based assembly224US 5,148,591 ASensor Adaptive Machines, Inc. · 1992
- Determining position or orientation of object in three dimensions185US 6,301,763 B1Great Lakes Intellectual Property · 2001
- Vision target based assembly168US 6,163,946 AGreat Lakes Intellectual Property · 2000